Determining resonant frequencies and magnetic influence factors of materials in the earth

ABSTRACT

A method for calculating a magnetic influence factor (MIF) between an atom and a resonant atom of a molecule of a material includes determining a current magnetic field strength at a test location above a quantity of material buried at the test location, transmitting a test signal from an antenna at the test location, the test signal comprising a test fundamental frequency, and detecting, at the test location, a reflected wave comprising the test fundamental frequency on the antenna. The method includes varying the test fundamental frequency while retransmitting the test signal and detecting a reflected wave until reflected waves of various test frequencies are detected and identifying from the detected reflected waves a resonant frequency corresponding to a maximum magnitude of the detected reflected waves. The material includes molecules with a resonant atom and at least one atom different than the resonant atom.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to U.S. Provisional Patent ApplicationNo. 63/212,590 entitled “DETERMINING PRESENCE AND DEPTH OF MATERIALS INTHE EARTH” and filed on Jun. 18, 2021, for Philip Clegg, which isincorporated herein by reference.

FIELD

This invention relates to determining the presence and depth ofmaterials in the earth and more particularly relates to mineralsignature detection to determine the presence and depth of materials inthe earth.

BACKGROUND

Many methods have been used over time to locate minerals and othermaterials below the earth's surface. For example, water detection belowthe earth for drilling water wells often requires drilling multiple testwells to map out underground aquifers for farming and providing water tocities, communities, etc. Oil exploration is very expensive and hasoften been inaccurate. Location of minerals/materials buried in theearth is extremely useful.

BRIEF SUMMARY

A method for determining depth of a material is disclosed. The methodincludes transmitting a signal from an antenna at a location. The signalincludes a fundamental frequency and the signal penetrates ground underthe location. The location is selected to locate a material at a depthunder the location. The fundamental frequency matches a known resonantfrequency of a resonant atom of a molecule of the material. The methodincludes detecting a reflected wave on the antenna, determining a timedifference between transmission of the signal and detection of thereflected wave on the antenna, and determining the depth to the materialbased on the time difference and a reflected velocity corresponding tothe resonant atom.

An apparatus for determining depth of a material includes a transmissioncircuit configured to transmit a signal from an antenna at a location.The signal includes a fundamental frequency and the signal penetratesground under the location. The location is selected to locate a materialat a depth under the location and the fundamental frequency matches aknown resonant frequency of a resonant atom of a molecule of thematerial. The apparatus includes a wave detector configured to detect areflected wave on the antenna, a timer configured to determine a timedifference between transmission of the signal and detection of thereflected wave on the antenna, and a depth calculator configured todetermine the depth to the material based on the time difference and areflected velocity corresponding to the resonant atom.

A method for calculating a magnetic influence factor (MIF) between anatom and a resonant atom of a molecule of a material includesdetermining a current magnetic field strength at a test location above aquantity of material buried at the test location, transmitting a testsignal from an antenna at the test location, the test signal comprisinga test fundamental frequency, and detecting, at the test location, areflected wave comprising the test fundamental frequency on the antenna.The method includes varying the test fundamental frequency whileretransmitting the test signal and detecting a reflected wave untilreflected waves of various test frequencies are detected and identifyingfrom the detected reflected waves a resonant frequency corresponding toa maximum magnitude of the detected reflected waves. The materialincludes molecules with a resonant atom and at least one atom differentthan the resonant atom.

An apparatus for calculating a magnetic influence factor (MIF) betweenan atom and a resonant atom of a molecule of a material includes amagnetometer configured to determine a current magnetic field strengthat a test location above a quantity of material buried at the testlocation, and a transmission circuit configured to transmit a testsignal from an antenna at the test location. The test signal includes atest fundamental frequency. The apparatus includes a wave detectorconfigured to detect, at the test location, a reflected wave comprisingthe test fundamental frequency on the antenna and a depth calculatorconfigured to vary the test fundamental frequency while the transmissioncircuit retransmits the test signal and the wave detector detects areflected wave until reflected waves of various test frequencies aredetected, and a resonant frequency calculator is configured to identifyfrom the detected reflected waves a resonant frequency corresponding toa maximum magnitude of the detected reflected waves. The materialincludes molecules with a resonant atom and at least one atom differentthan the resonant atom.

An antenna for determining a depth of a material includes a rod, a coilwound around the rod, and a DC current source configured to transmit aDC current in the coil. DC current in the coil induces anelectromagnetic field with a particular polarity in the antenna and DCcurrent in an opposite direction in the coil induces an electromagneticfield with an opposite polarity in the rod. The antenna includes asignal generator connected to the rod. The signal generator isconfigured to transmit a signal comprising a fundamental frequency tothe rod. The antenna includes a transmission circuit configured to causethe signal generator to transmit the signal to the rod. The rod ispositioned horizontally while transmitting the signal, where thefundamental frequency is a resonant frequency of a molecule of amaterial buried below a location where the antenna is located. Theresonant frequency is correlated to a resonant atom of the molecule andone or more magnetic influence factors (MIF). Each MIF includes anamount of magnetic influence between the resonant atom and an atom ofthe molecule different from the resonant atom. The antenna includes awave detector configured to detect a reflected wave. Detection of thereflected wave includes detecting a downward force on the rod above athreshold. The antenna includes a timer configured to measure a timedifference between transmission of the signal and detection of thereflected wave, and a depth calculator configured to determine a depthof the material based on the time difference and a reflected velocitycorresponding to the resonant atom.

BRIEF DESCRIPTION OF THE DRAWINGS

In order that the advantages of the invention will be readilyunderstood, a more particular description of the invention brieflydescribed above will be rendered by reference to specific embodimentsthat are illustrated in the appended drawings. Understanding that thesedrawings depict only typical embodiments of the invention and are nottherefore to be considered to be limiting of its scope, the inventionwill be described and explained with additional specificity and detailthrough the use of the accompanying drawings, in which:

FIG. 1 is a schematic block diagram illustrating a locator apparatus fordetermining presence and depth of materials in the earth, according tovarious embodiments;

FIG. 2 is a schematic block diagram illustrating using the locatorapparatus of FIG. 1 to determine presence and depth of materials in theearth, according to various embodiments;

FIG. 3 is a schematic block diagram illustrating another locatorapparatus of FIG. 1 with various ways to determine presence of areflected wave after a signal has been sent;

FIG. 4 is a schematic block diagram illustrating another locatorapparatus for determining presence and depth of materials in the earth,according to various embodiments;

FIG. 5 is a schematic flowchart diagram illustrating a method fordetermining presence and depth of materials in the earth, according tovarious embodiments;

FIG. 6A is a first part of a schematic flowchart diagram illustratinganother method for determining presence and depth of materials in theearth, according to various embodiments;

FIG. 6B is a second part of the method of FIG. 6A.

FIG. 7 is a schematic flowchart diagram illustrating a method fordetermining a magnetic influence factor, according to variousembodiments;

FIG. 8 is a schematic flowchart diagram illustrating another method fordetermining a magnetic influence factor, according to variousembodiments;

FIG. 9 is a diagram illustrating Larmor precession of an atom, accordingto various embodiments;

FIG. 10 is a diagram illustrating three spin orientations for a watermolecule, according to various embodiments;

FIG. 11 is a table illustrating magnetic influence factors and otherinformation for various molecules of minerals, according to variousembodiments;

FIG. 12 is a diagram illustrating spin orientations for two molecules,according to various embodiments;

FIG. 13 is a table illustrating magnetic influence factors and otherinformation for various molecules of silicon dioxide, according tovarious embodiments;

FIG. 14 is a schematic block diagram illustrating various combinationsof magnetic spin of a resonant atom and related atoms for the table ofFIG. 13 , according to various embodiments; and

FIG. 15 is a schematic block diagram illustrating a local magnetic fieldmeasuring station, according to various embodiments.

DETAILED DESCRIPTION

Reference throughout this specification to “one embodiment,” “anembodiment,” or similar language means that a particular feature,structure, or characteristic described in connection with the embodimentis included in at least one embodiment. Thus, appearances of the phrases“in one embodiment,” “in an embodiment,” and similar language throughoutthis specification may, but do not necessarily, all refer to the sameembodiment, but mean “one or more but not all embodiments” unlessexpressly specified otherwise. The terms “including,” “comprising,”“having,” and variations thereof mean “including but not limited to”unless expressly specified otherwise. An enumerated listing of itemsdoes not imply that any or all of the items are mutually exclusiveand/or mutually inclusive, unless expressly specified otherwise. Theterms “a,” “an,” and “the” also refer to “one or more” unless expresslyspecified otherwise.

Furthermore, the described features, advantages, and characteristics ofthe embodiments may be combined in any suitable manner. One skilled inthe relevant art will recognize that the embodiments may be practicedwithout one or more of the specific features or advantages of aparticular embodiment. In other instances, additional features andadvantages may be recognized in certain embodiments that may not bepresent in all embodiments.

These features and advantages of the embodiments will become more fullyapparent from the following description and appended claims, or may belearned by the practice of embodiments as set forth hereinafter. As willbe appreciated by one skilled in the art, aspects of the presentinvention may be embodied as a system, method, and/or computer programproduct. Accordingly, aspects of the present invention may take the formof an entirely hardware embodiment, an entirely software embodiment(including firmware, resident software, micro-code, etc.) or anembodiment combining software and hardware aspects that may allgenerally be referred to herein as a “circuit,” “module,” “system,”“calculator,” “detector,” etc. Furthermore, aspects of the presentinvention may take the form of a computer program product embodied inone or more computer readable medium(s) having program code embodiedthereon.

Many of the functional units described in this specification have beenlabeled as circuit, module, system, calculator, “detector, etc., inorder to more particularly emphasize their implementation independence.For example, a circuit, module, system, calculator, detector, etc. maybe implemented as a hardware circuit comprising custom very large scaleintegrated (“VLSI”) circuits or gate arrays, off-the-shelfsemiconductors such as logic chips, transistors, or other discretecomponents. A circuit, module, system, calculator, detector, etc. mayalso be implemented in programmable hardware devices such as a fieldprogrammable gate array (“FPGA”), programmable array logic, programmablelogic devices or the like.

A portion or all of circuit, module, system, calculator, detector, etc.may also be implemented in software for execution by various types ofprocessors. An identified circuit, module, system, calculator, detector,etc. with program code may, for instance, comprise one or more physicalor logical blocks of computer instructions which may, for instance, beorganized as an object, procedure, or function. Nevertheless, theexecutables of an identified circuit, module, system, calculator,detector, etc. need not be physically located together, but may comprisedisparate instructions stored in different locations which, when joinedlogically together, comprise the circuit, module, system, calculator,detector, etc. and achieve the stated purpose for the circuit, module,system, calculator, detector, etc.

Where a circuit, module, system, calculator, detector, etc. or portionsof a circuit, module, system, calculator, detector, etc. are implementedin software, the program code may be stored and/or propagated on in oneor more computer readable medium(s). The computer program product mayinclude a computer readable storage medium (or media) having computerreadable program instructions thereon for causing a processor to carryout aspects of the present invention.

The computer readable storage medium can be a tangible device that canretain and store instructions for use by an instruction executiondevice. The computer readable storage medium may be, for example, but isnot limited to, an electronic storage device, a magnetic storage device,an optical storage device, an electromagnetic storage device, asemiconductor storage device, or any suitable combination of theforegoing. A non-exhaustive list of more specific examples of thecomputer readable storage medium includes the following: a portablecomputer diskette, a hard disk, a random access memory (“RAM”), aread-only memory (“ROM”), an erasable programmable read-only memory(“EPROM” or Flash memory), a static random access memory (“SRAM”), aportable compact disc read-only memory (“CD-ROM”), a digital versatiledisk (“DVD”), a memory stick, a floppy disk, a mechanically encodeddevice such as punch-cards or raised structures in a groove havinginstructions recorded thereon, and any suitable combination of theforegoing. A computer readable storage medium, as used herein, is not tobe construed as being transitory signals per se, such as radio waves orother freely propagating electromagnetic waves, electromagnetic wavespropagating through a waveguide or other transmission media (e.g., lightpulses passing through a fiber-optic cable), or electrical signalstransmitted through a wire.

Computer readable program instructions described herein can bedownloaded to respective computing/processing devices from a computerreadable storage medium or to an external computer or external storagedevice via a network, for example, the Internet, a local area network, awide area network and/or a wireless network. The network may comprisecopper transmission cables, optical transmission fibers, wirelesstransmission, routers, firewalls, switches, gateway computers and/oredge servers. A network adapter card or network interface in eachcomputing/processing device receives computer readable programinstructions from the network and forwards the computer readable programinstructions for storage in a computer readable storage medium withinthe respective computing/processing device.

Computer readable program instructions for carrying out operations ofthe present invention may be assembler instructions,instruction-set-architecture (“ISA”) instructions, machine instructions,machine dependent instructions, microcode, firmware instructions,state-setting data, or either source code or object code written in anycombination of one or more programming languages, including an objectoriented programming language such as Smalltalk, C++ or the like, andconventional procedural programming languages, such as the “C”programming language or similar programming languages. The computerreadable program instructions may execute entirely on the user'scomputer, partly on the user's computer, as a stand-alone softwarepackage, partly on the user's computer and partly on a remote computeror entirely on the remote computer or server. In the latter scenario,the remote computer may be connected to the user's computer through anytype of network, including a local area network (“LAN”) or a wide areanetwork (“WAN”), or the connection may be made to an external computer(for example, through the Internet using an Internet Service Provider).In some embodiments, electronic circuitry including, for example,programmable logic circuitry, field-programmable gate arrays (“FPGA”),or programmable logic arrays (“PLA”) may execute the computer readableprogram instructions by utilizing state information of the computerreadable program instructions to personalize the electronic circuitry,in order to perform aspects of the present invention.

Aspects of the present invention are described herein with reference toflowchart illustrations and/or block diagrams of methods, apparatus(systems), and computer program products according to embodiments of theinvention. It will be understood that each block of the flowchartillustrations and/or block diagrams, and combinations of blocks in theflowchart illustrations and/or block diagrams, can be implemented bycomputer readable program instructions.

These computer readable program instructions may be provided to aprocessor of a general purpose computer, special purpose computer, orother programmable data processing apparatus to produce a machine, suchthat the instructions, which execute via the processor of the computeror other programmable data processing apparatus, create means forimplementing the functions/acts specified in the flowchart and/or blockdiagram block or blocks. These computer readable program instructionsmay also be stored in a computer readable storage medium that can directa computer, a programmable data processing apparatus, and/or otherdevices to function in a particular manner, such that the computerreadable storage medium having instructions stored therein comprises anarticle of manufacture including instructions which implement aspects ofthe function/act specified in the flowchart and/or block diagram blockor blocks.

The computer readable program instructions may also be loaded onto acomputer, other programmable data processing apparatus, or other deviceto cause a series of operational steps to be performed on the computer,other programmable apparatus or other device to produce a computerimplemented process, such that the instructions which execute on thecomputer, other programmable apparatus, or other device implement thefunctions/acts specified in the flowchart and/or block diagram block orblocks.

Many of the functional units described in this specification have beenlabeled as circuits, modules, calculators, detectors, etc., in order tomore particularly emphasize their implementation independence. Forexample, a circuit, module, calculator, detector, etc. may beimplemented as a hardware circuit comprising custom VLSI circuits orgate arrays, off-the-shelf semiconductors such as logic chips,transistors, or other discrete components. Circuits, modules,calculators, detectors, etc. may also be implemented in programmablehardware devices such as field programmable gate arrays, programmablearray logic, programmable logic devices or the like.

A circuit, module, calculator, detector, etc. may also be implemented insoftware for execution by various types of processors. An identifiedcircuit, module, calculator, detector, etc. of program instructions may,for instance, comprise one or more physical or logical blocks ofcomputer instructions which may, for instance, be organized as anobject, procedure, or function. Nevertheless, the executables of anidentified circuit, module, calculator, detector, etc. need not bephysically located together, but may comprise disparate instructionsstored in different locations which, when joined logically together,comprise the circuit, module, calculator, detector, etc. and achieve thestated purpose for the circuit, module, calculator, detector, etc.

The schematic flowchart diagrams and/or schematic block diagrams in theFigures illustrate the architecture, functionality, and operation ofpossible implementations of apparatuses, systems, methods, and computerprogram products according to various embodiments of the presentinvention. In this regard, each block in the schematic flowchartdiagrams and/or schematic block diagrams may represent a module,segment, or portion of code, which comprises one or more executableinstructions of the program code for implementing the specified logicalfunction(s).

It should also be noted that, in some alternative implementations, thefunctions noted in the block may occur out of the order noted in theFigures. For example, two blocks shown in succession may, in fact, beexecuted substantially concurrently, or the blocks may sometimes beexecuted in the reverse order, depending upon the functionalityinvolved. Other steps and methods may be conceived that are equivalentin function, logic, or effect to one or more blocks, or portionsthereof, of the illustrated Figures.

Although various arrow types and line types may be employed in theflowchart and/or block diagrams, they are understood not to limit thescope of the corresponding embodiments. Indeed, some arrows or otherconnectors may be used to indicate only the logical flow of the depictedembodiment. For instance, an arrow may indicate a waiting or monitoringperiod of unspecified duration between enumerated steps of the depictedembodiment. It will also be noted that each block of the block diagramsand/or flowchart diagrams, and combinations of blocks in the blockdiagrams and/or flowchart diagrams, can be implemented by specialpurpose hardware-based systems that perform the specified functions oracts, or combinations of special purpose hardware and program code.

As used herein, a list with a conjunction of “and/or” includes anysingle item in the list or a combination of items in the list. Forexample, a list of A, B and/or C includes only A, only B, only C, acombination of A and B, a combination of B and C, a combination of A andC or a combination of A, B and C. As used herein, a list using theterminology “one or more of” includes any single item in the list or acombination of items in the list. For example, one or more of A, B and Cincludes only A, only B, only C, a combination of A and B, a combinationof B and C, a combination of A and C or a combination of A, B and C. Asused herein, a list using the terminology “one of' includes one and onlyone of any single item in the list. For example, “one of A, B and C”includes only A, only B or only C and excludes combinations of A, B andC. As used herein, “a member selected from the group consisting of A, B,and C,” includes one and only one of A, B, or C, and excludescombinations of A, B, and C.” As used herein, “a member selected fromthe group consisting of A, B, and C and combinations thereof” includesonly A, only B, only C, a combination of A and B, a combination of B andC, a combination of A and C or a combination of A, B and C.

A method for determining depth of a material is disclosed. The methodincludes transmitting a signal from an antenna at a location. The signalincludes a fundamental frequency and the signal penetrates ground underthe location. The location is selected to locate a material at a depthunder the location. The fundamental frequency matches a known resonantfrequency of a resonant atom of a molecule of the material. The methodincludes detecting a reflected wave on the antenna, determining a timedifference between transmission of the signal and detection of thereflected wave on the antenna, and determining the depth to the materialbased on the time difference and a reflected velocity corresponding tothe resonant atom.

In some embodiments, the antenna is a first antenna set to a magneticpolarity and the signal is from the first antenna is a first signal. Thetime difference is a first time difference, the depth of the material isa depth to a top of the material, and the method includes, whiletransmitting the first signal by the first antenna, transmitting asecond signal from a second antenna located a distance from the firstantenna, where the second signal includes the fundamental frequency andthe second antenna is set to an opposite magnetic polarity as themagnetic polarity of the first antenna, detecting a reflected wave onthe second antenna, repeating, at varying distances from the firstantenna, transmitting the second signal and detecting a reflected waveon the second signal to find an edge location where a reflected wave isnot detected by the second antenna, transmitting the second signal fromthe second antenna at a signal detection location, and detecting asecond reflected wave on the second antenna at the signal detectionlocation. The signal detection location is located nearer the firstantenna than the edge location and close to the edge location. In theembodiments, the method includes determining a second time differencebetween transmission of the second signal and detection of the secondreflected wave on the second antenna, determining a second timedifference between the first time difference and the second timedifference, determining the depth of a bottom of the material based onthe second time difference and the reflected velocity corresponding tothe resonant atom, and determining a thickness of the material bysubtracting the depth of the top of the material and the depth of thebottom of the material.

In some embodiments, the antenna includes a rod, a coil wound around therod, a direct current (“DC”) current source configured to transmit a DCcurrent in the coil, where DC current in the coil induces a magneticpolarity in the antenna and DC current in an opposite direction in thecoil induces an opposite magnetic polarity in the rod, and a signalgenerator connected to the rod. The signal generator is configured totransmit the fundamental frequency to the rod. The rod is positionedhorizontally while transmitting the signal and detecting the reflectedwave, and detecting the reflected wave includes detecting a downwardforce on the rod. In other embodiments, detecting the downward forceincludes detecting the downward force on a strain gauge connected to therod above a threshold, and/or detecting movement of the rod in adownward direction includes detecting downward movement of the rodsufficient to overcome a spring force in an upward direction exerted bya spring mechanism supporting the rod.

In some embodiments, the known resonant frequency is calculated based ona resonant frequency equation:

RF=|(B+ΣMI F)(L)|

wherein:

-   -   RF is the resonant frequency;    -   B is a magnetic field strength at the location;    -   L is a Larmor Precessional Frequency of the resonant atom; and    -   ΣMIF is a summation of magnetic influence factors of other atoms        of the molecule of the material different from the resonant        atom, wherein a magnetic influence factor (MIF) of an atom of        the other atoms of the molecule comprises a magnetic influence        of the atom with respect to the resonant atom.

In other embodiments, in response to not detecting the reflected wave onthe antenna, the method includes adjusting the magnetic field strength Bat the location to correspond to a depth below the location, changingthe resonant frequency to an adjusted resonant frequency based on theresonant frequency equation and the adjusted magnetic field strength Bfor the depth below the location, transmitting an adjusted signal fromthe antenna at the location, the adjusted signal comprising an adjustedfundamental frequency, the adjusted fundamental frequency based on theadjusted resonant frequency, and attempting to detect a reflected waveon the antenna. In response to detecting the reflected wave on theantenna, determining a time difference between transmission of theadjusted signal and detection of the reflected wave on the antenna, anddetermining the depth to the material based on the time difference and areflected velocity corresponding to the resonant atom. In response tonot detecting the reflected wave on the antenna, further adjusting themagnetic field strength B at the location to another depth below thelocation. In the embodiments, the method includes repeating adjustmentof the magnetic field strength B at the location to another depth untildetecting the reflected wave on the antenna or exhausting a plannednumber of attempts at different depths below the location within a depthrange.

In other embodiments, the ΣMIF is based on atoms of the molecule of thematerial located within two connections away from the resonant atom withrespect to covalent bonds of a structure of atoms of the molecule. Inother embodiments, the MIF of an atom of the other atoms is based on amagnetic spin with relation to a magnetic spin of the resonant atom. Inother embodiments, the MIF between an atom of the molecule differentfrom the resonant atom of the molecule of the material is determined bydetermining a current magnetic field strength at a test location above aquantity of the material, transmitting a test signal from the antenna atthe test location, the test signal comprising a test fundamentalfrequency, detecting, at the test location, a reflected wave comprisingthe test fundamental frequency on the antenna, varying the testfundamental frequency while retransmitting the test signal and detectinga reflected wave until reflected waves of various test fundamentalfrequencies are detected and determining from the detected reflectedwaves a resonant frequency corresponding to a maximum magnitude of thedetected reflected waves, and calculating the MIF between the differentatom and the resonant atom of the molecule of the material using thedetermined magnetic field strength at the test location, a LarmorPrecessional Frequency of the resonant atom, the resonant frequencycorresponding to the maximum magnitude of the reflected wave, and theresonant frequency equation.

In other embodiments, the MIF and resonant frequency of a molecule ofthe material with a same nuclear spin for the resonant atom and thedifferent atom differs from the MIF and resonant frequency of a moleculeof the material with a nuclear spin of the resonant atom being oppositethe nuclear spin of the different atom. In other embodiments, the methodincludes measuring the magnetic field strength at the location and usingthe measured magnetic field strength to determine the resonantfrequency. In other embodiments, the known resonant frequency iscalculated prior to transmitting the signal and is based on real timemeasurements of the magnetic field strength at the location and/or at asurface at the location or at a chosen depth below the location.

An apparatus for determining depth of a material includes a transmissioncircuit configured to transmit a signal from an antenna at a location.The signal includes a fundamental frequency and the signal penetratesground under the location. The location is selected to locate a materialat a depth under the location and the fundamental frequency matches aknown resonant frequency of a resonant atom of a molecule of thematerial. The apparatus includes a wave detector configured to detect areflected wave on the antenna, a timer configured to determine a timedifference between transmission of the signal and detection of thereflected wave on the antenna, and a depth calculator configured todetermine the depth to the material based on the time difference and areflected velocity corresponding to the resonant atom.

In some embodiments, the transmission circuit is a first transmissioncircuit, the wave detector is a first wave detector, the timer is afirst timer, the depth calculator is a first depth calculator, theantenna is a first antenna set to a magnetic polarity, the signal fromthe first antenna is a first signal, the time difference is a first timedifference, the depth of the material is a depth to a top of thematerial, and the apparatus includes, while transmitting the firstsignal by the first antenna, a second transmission circuit configured totransmit a second signal from a second antenna located a distance fromthe first antenna, where the second signal includes the fundamentalfrequency and the second antenna set to an opposite magnetic polarity asthe magnetic polarity of the first antenna, a second wave detectorconfigured to detect a reflected wave on the second antenna, and thesecond transmission circuit is configured to repeat, at varyingdistances from the first antenna, transmitting the second signal anddetecting a reflected wave on the second signal to find an edge locationwhere a reflected wave is not detected by the second wave detector atthe second antenna.

In the embodiments, the second transmission circuit is configured totransmit the second signal from the second antenna at a signal detectionlocation, the second wave detector is configured to detect a secondreflected wave on the second antenna at the signal detection location,where the signal detection location is located nearer the first antennathan the edge location and close to the edge location, a second timer isconfigured to determine a second time difference between transmission ofthe second signal and detection of the second reflected wave on thesecond antenna, a second depth calculator is configured to determine asecond time difference between the first time difference and the secondtime difference, the second depth calculator is configured to determinethe depth of a bottom of the material based on the second timedifference and the reflected velocity corresponding to the resonantatom, and a thickness calculator is configured to determine a thicknessof the material by subtracting the depth of the top of the material andthe depth of the bottom of the material.

In some embodiments, the antenna includes a rod, a coil wound around therod, a DC current source configured to transmit a DC current in thecoil, where DC current in the coil induces a magnetic polarity in theantenna and DC current in an opposite direction in the coil induces anopposite magnetic polarity in the rod, and a signal generator connectedto the rod, the signal generator configured to transmit the fundamentalfrequency to the rod. The rod is positioned horizontally whiletransmitting the signal and detecting the reflected wave, and detectingthe reflected wave includes detecting a downward force on the rod. Insome embodiments, the wave detector detecting the downward forceincludes detecting the downward force on a strain gauge connected to therod above a threshold and/or detecting movement of the rod in a downwarddirection includes detecting downward movement of the rod sufficient toovercome a spring force in an upward direction exerted by a springmechanism supporting the rod.

In some embodiments, the depth calculator is configured to calculate theknown resonant frequency based on a resonant frequency equation:

RF=|(B+ΣMIF)(L)|

where RF is the resonant frequency, B is a magnetic field strength atthe location, L is a Larmor Precessional Frequency of the resonant atom,and ΣMIF is a summation of magnetic influence factors of other atoms ofthe molecule of the material different from the resonant atom. Amagnetic influence factor (MIF) of an atom of the other atoms of themolecule comprises a magnetic influence of the atom with respect to theresonant atom.

In some embodiments, in response to the depth calculator not detectingthe reflected wave on the antenna, the apparatus includes a depth moduleconfigured to adjust the magnetic field strength B at the location tocorrespond to a depth below the location, and a resonant frequencychange module configured to change the resonant frequency to an adjustedresonant frequency based on the resonant frequency equation and theadjusted magnetic field strength B for the depth below the location. Inthe embodiment, the transmission circuit is configured to transmit anadjusted signal from the antenna at the location. The adjusted signalincludes an adjusted fundamental frequency and the adjusted fundamentalfrequency is based on the adjusted resonant frequency. In theembodiments, the wave detector is configured to attempt to detect areflected wave on the antenna, and in response to detecting thereflected wave on the antenna, a timer configured to determine a timedifference between transmission of the adjusted signal and detection ofthe reflected wave on the antenna, and the depth calculator isconfigured to determine the depth to the material based on the timedifference and a reflected velocity corresponding to the resonant atom.In response to not detecting the reflected wave on the antenna, thedepth module is further configured to adjust the magnetic field strengthB at the location to another depth below the location, and the depthmodule is configured to repeat adjustment of the magnetic field strengthB at the location to another depth until the wave detector detects thereflected wave on the antenna or exhausts a planned number of attemptsat different depths below the location within a depth range.

In some embodiments, the ΣMIF is based on atoms of the molecule of thematerial located within two connections away from the resonant atom withrespect to covalent bonds of a structure of atoms of the molecule. Inother embodiments, the MIF of an atom of the other atoms is based on amagnetic spin with relation to a magnetic spin of the resonant atom.

In some embodiments, the MIF between an atom of the molecule differentfrom the resonant atom of the molecule of the material is determined bya magnetometer configured to determine a current magnetic field strengthat a test location above a quantity of the material, the transmissioncircuit is configured to transmit a test signal from the antenna at thetest location, where the test signal includes a test fundamentalfrequency, the wave detector is configured to detect, at the testlocation, a reflected wave comprising the test fundamental frequency onthe antenna, the depth calculator is configured to vary the testfundamental frequency while retransmitting the test signal and the wavedetector is configured to detect a reflected wave until reflected wavesof various test fundamental frequencies are detected and the apparatusincludes a resonant frequency calculator configured to determine fromthe detected reflected waves a resonant frequency corresponding to amaximum magnitude of the detected reflected waves. An MIF module isconfigured to calculate the MIF between the different atom and theresonant atom of the molecule of the material using the determinedmagnetic field strength at the test location, a Larmor PrecessionalFrequency of the resonant atom, the resonant frequency corresponding tothe maximum magnitude of the reflected wave, and the resonant frequencyequation.

In some embodiments, the MIF and resonant frequency of a molecule of thematerial with a same nuclear spin for the resonant atom and thedifferent atom differs from the MIF and resonant frequency of a moleculeof the material with a nuclear spin of the resonant atom being oppositethe nuclear spin of the different atom. In other embodiments, theapparatus includes a magnetometer configured to measure the magneticfield strength at the location and using the measured magnetic fieldstrength to determine the resonant frequency. In other embodiments, theknown resonant frequency is calculated prior to transmitting the signaland is based on real time measurements of the magnetic field strength atthe location and/or at a surface at the location or at a chosen depthbelow the location.

A method for calculating a magnetic influence factor (MIF) between anatom and a resonant atom of a molecule of a material includesdetermining a current magnetic field strength at a test location above aquantity of material buried at the test location, transmitting a testsignal from an antenna at the test location, the test signal comprisinga test fundamental frequency, and detecting, at the test location, areflected wave comprising the test fundamental frequency on the antenna.The method includes varying the test fundamental frequency whileretransmitting the test signal and detecting a reflected wave untilreflected waves of various test frequencies are detected and identifyingfrom the detected reflected waves a resonant frequency corresponding toa maximum magnitude of the detected reflected waves.

In some embodiments, an equation for the resonant frequency is:

RF=|(B+MIF)(L)|

wherein:

-   -   RF is the resonant frequency;    -   B is a magnetic field strength at the test location; and    -   L is a Larmor Precessional Frequency of the resonant atom.        In other embodiments, the material includes molecules with a        resonant atom and at least one atom different than the resonant        atom, and the resonant frequency corresponds to magnetic        influence factor (MIF) between the different atom and the        resonant atom of the molecule of the material and the method        includes calculating the MIF between the different atom and the        resonant atom using the determined magnetic field strength at        the test location, a Larmor Precessional Frequency of the        resonant atom, the resonant frequency corresponding to the        maximum magnitude of the reflected wave, and a resonant        frequency equation. In other embodiments, in response to        determining a MIF for each atom of the molecule different than        the resonant atom, the method includes transmitting a second        test signal from the antenna at the test location. The second        test signal includes a second test fundamental frequency        corresponding to a combination of two or more atoms and/or        magnetic spins of the two or more atoms of the molecule of the        material different than the combination of two or more atoms        and/or magnetic spins of the two or more atoms assumed for        determining a first resonant frequency.

In the embodiments, the method includes detecting, at the test location,a reflected wave comprising the second test fundamental frequency on theantenna, and varying the second test fundamental frequency whileretransmitting the second test signal and detecting a reflected waveuntil reflected waves of various second test fundamental frequencies aredetected and identifying from the detected reflected waves a resonantfrequency corresponding to a maximum magnitude of the detected reflectedwaves. The resonant frequency corresponds to a summed magnetic influencefactor (ΣMIF) between the different atoms and the resonant atom of themolecule of the material. In the embodiments, the method includescalculating the ΣMIF between the different atoms and the resonant atomusing the determined magnetic field strength at the test location, aLarmor Precessional Frequency of the resonant atom, the resonantfrequency corresponding to the maximum magnitude of the reflected wave,where each MIF for each atom of the molecule is different than theresonant atom, and a resonant frequency equation:

RF=|(B+ΣMIF)(L)|

wherein ΣMIF is a summation of magnetic influence factors of the atomsof the molecule of the material different from the resonant atom.

In some embodiments, the antenna includes a rod, a coil wound around therod, a DC current source configured to transmit a DC current in thecoil, where DC current in the coil induces a magnetic polarity in theantenna and DC current in an opposite direction in the coil induces anopposite magnetic polarity in the rod, and a signal generator connectedto the rod, the signal generator transmitting the test fundamentalfrequency to the rod. The rod is positioned horizontally whiletransmitting the test signal and detecting the reflected wave, anddetecting the reflected wave comprises detecting a downward force on therod.

In other embodiments, the method includes, from a location differentfrom the test location, transmitting a signal from the antenna at thelocation, where the signal includes a fundamental frequency, the signalpenetrates ground under the location, the location is selected to locatethe material at a depth under the location, and the fundamentalfrequency matches the resonant frequency of the resonant atom of themolecule of the material. In the embodiments, the method includesdetecting a reflected wave on the antenna, determining a time differencebetween transmission of the signal and detection of the reflected waveon the antenna, and determining the depth to the material based on thetime difference and a reflected velocity corresponding to the material.

In some embodiments, the antenna is a first antenna set to a magneticpolarity, the signal from the first antenna is a first signal, the timedifference is a first time difference, and the method includes, whiletransmitting the first signal by the first antenna, transmitting asecond signal from a second antenna located a distance from the firstantenna, where the second signal includes the fundamental frequency, andthe second antenna is set to an opposite magnetic polarity as themagnetic polarity of the first antenna, detecting a reflected wave onthe second antenna, and repeating, at varying distances from the firstantenna, transmitting the second signal and detecting a reflected waveon the second signal to find an edge location where a reflected wave isnot detected by the second antenna. In the embodiments, the methodincludes transmitting the second signal from the second antenna at asignal detection location, detecting a reflected wave on the secondantenna at the signal detection location, the signal detection locationlocated nearer the first antenna than the edge location and close to theedge location, determining a second time difference between transmissionof the second signal and detection of the reflected wave on the secondantenna, calculating a first/second time difference between the firsttime difference and the second time difference, and determining athickness of the material based on the first/second time difference andthe reflected velocity corresponding to the material.

In some embodiments, the reflected velocity corresponding to thematerial is an adjusted reflected velocity, where the adjusted reflectedvelocity is adjusted based on a measurement of magnetic field strengthat the test location based on equation:

${RV}^{*} = {\frac{\left( {B - {512.47{mG}}} \right)}{512.47{mG}*{RV}*1.517} + {RV}}$

wherein:

-   -   B is the magnetic field strength measured at the test location;        and    -   RV is a calculated reflected velocity of the material at a        reference location with a known depth of the material.

An apparatus for calculating a magnetic influence factor (MIF) betweenan atom and a resonant atom of a molecule of a material includes amagnetometer configured to determine a current magnetic field strengthat a test location above a quantity of material buried at the testlocation, and a transmission circuit configured to transmit a testsignal from an antenna at the test location. The test signal includes atest fundamental frequency. The apparatus includes a wave detectorconfigured to detect, at the test location, a reflected wave comprisingthe test fundamental frequency on the antenna and a depth calculatorconfigured to vary the test fundamental frequency while the transmissioncircuit retransmits the test signal and the wave detector detects areflected wave until reflected waves of various test frequencies aredetected, and a resonant frequency calculator is configured to identifyfrom the detected reflected waves a resonant frequency corresponding toa maximum magnitude of the detected reflected waves. The materialincludes molecules with a resonant atom and at least one atom differentthan the resonant atom.

In some embodiments, an equation for the resonant frequency is:

RF=|(B+MIF)(L)|

where RF is the resonant frequency, B is a magnetic field strength atthe test location, and L is a Larmor Precessional Frequency of theresonant atom. In other embodiments, the resonant frequency correspondsto magnetic influence factor (MIF) between the different atom and theresonant atom of the molecule of the material, and the apparatusincludes an MIF module configured to calculate the MIF between thedifferent atom and the resonant atom using the determined magnetic fieldstrength at the test location, a Larmor Precessional Frequency of theresonant atom, the resonant frequency corresponding to the maximummagnitude of the reflected wave, and a resonant frequency equation.

In some embodiments, in response to the MIF module determining a MIF foreach atom of the molecule different than the resonant atom, thetransmission circuit is configured to transmit a second test signal fromthe antenna at the test location. The second test signal is a secondtest fundamental frequency corresponding to a combination of two or moreatoms and/or magnetic spins of the two or more atoms of the molecule ofthe material different than the combination of two or more atoms and/ormagnetic spins of the two or more atoms assumed for determining a firstresonant frequency. In the embodiments, the wave detector is furtherconfigured to detect, at the test location, a reflected wave comprisingthe second test fundamental frequency on the antenna and the depthcalculator is further configured to vary the second test fundamentalfrequency while the transmission circuit retransmits the second testsignal and the wave detector is configured to detect a reflected waveuntil reflected waves of various second test fundamental frequencies aredetected and the apparatus includes a resonant frequency calculatorconfigured to identify from the detected reflected waves a resonantfrequency corresponding to a maximum magnitude of the detected reflectedwaves, wherein the resonant frequency corresponds to a summed magneticinfluence factor (ΣMIF) between the different atoms and the resonantatom of the molecule of the material. In the embodiments, the apparatusthe MIF module is further configured to calculate the ΣMIF between thedifferent atoms and the resonant atom using the determined magneticfield strength at the test location, a Larmor Precessional Frequency ofthe resonant atom, the resonant frequency corresponding to the maximummagnitude of the reflected wave, each MIF for each atom of the moleculedifferent than the resonant atom and a resonant frequency equation:

RF=|(B+ΣMIF)(L)|

wherein ΣMIF is a summation of magnetic influence factors of the atomsof the molecule of the material different from the resonant atom.

In some embodiments, the antenna includes a rod, a coil wound around therod, a DC current source configured to transmit a DC current in thecoil, where DC current in the coil induces a magnetic polarity in theantenna and DC current in an opposite direction in the coil induces anopposite magnetic polarity in the rod, and a signal generator connectedto the rod, the signal generator transmitting the test fundamentalfrequency to the rod. The rod is positioned horizontally whiletransmitting the test signal and detecting the reflected wave. Detectingthe reflected wave includes detecting a downward force on the rod.

In other embodiments, the apparatus includes, from a location differentfrom the test location, the transmission circuit is configured totransmit a signal from the antenna at the location. The signal includesa fundamental frequency, the signal penetrates ground under thelocation, the location is selected to locate the material at a depthunder the location, and the fundamental frequency matches the resonantfrequency of the resonant atom of the molecule of the material. In theembodiments, the wave detector is configured to detect a reflected waveon the antenna, a timer configured to determine a time differencebetween transmission of the signal and detection of the reflected waveon the antenna, and the depth calculator is configured to determine thedepth to the material based on the time difference and a reflectedvelocity corresponding to the material.

In some embodiments, the transmission circuit is a first transmissioncircuit, the wave detector is a first wave detector, the timer is afirst timer, the depth calculator is a first depth calculator, theantenna is a first antenna set to a magnetic polarity, the signal fromthe first antenna is a first signal, the time difference is a first timedifference, the depth of the material is a depth to a top of thematerial, and the apparatus includes, while transmitting the firstsignal by the first antenna, a second transmission circuit configured totransmit a second signal from a second antenna located a distance fromthe first antenna, where the second signal includes the fundamentalfrequency and the second antenna set to an opposite magnetic polarity asthe magnetic polarity of the first antenna, a second wave detectorconfigured to detect a reflected wave on the second antenna, and thesecond transmission circuit is configured to repeat, at varyingdistances from the first antenna, transmitting the second signal anddetecting a reflected wave on the second signal to find an edge locationwhere a reflected wave is not detected by the second antenna. In theembodiments, the second transmission circuit is configured to transmitthe second signal from the second antenna at a signal detectionlocation, the second wave detector is configured to detect a reflectedwave on the second antenna at the signal detection location, where thesignal detection location is located nearer the first antenna than theedge location and close to the edge location, a second timer isconfigured to determine a second time difference between transmission ofthe second signal and detection of the reflected wave on the secondantenna, a second depth calculator is configured to determine afirst/second time difference between the first time difference and thesecond time difference, and a thickness calculator is configured todetermine a thickness of the material based on the first/second timedifference and the reflected velocity corresponding to the material.

In some embodiments, the reflected velocity corresponding to thematerial is an adjusted reflected velocity, and the apparatus includes areflected velocity module configured to adjust the reflected velocitybased on a measurement of magnetic field strength, by a magnetometer, atthe test location based on equation:

${RV}^{*} = {\frac{\left( {B - {512.47{mG}}} \right)}{512.47{mG}*{RV}*1.517} + {RV}}$

where B is the magnetic field strength measured at the test location,and RV is a calculated reflected velocity of the material at a referencelocation with a known depth of the material.

An antenna for determining a depth of a material includes a rod, a coilwound around the rod, and a DC current source configured to transmit aDC current in the coil. DC current in the coil induces anelectromagnetic field with a particular polarity in the antenna and DCcurrent in an opposite direction in the coil induces an electromagneticfield with an opposite polarity in the rod. The antenna includes asignal generator connected to the rod. The signal generator isconfigured to transmit a signal comprising a fundamental frequency tothe rod. The antenna includes a transmission circuit configured to causethe signal generator to transmit the signal to the rod. The rod ispositioned horizontally while transmitting the signal, where thefundamental frequency is a resonant frequency of a molecule of amaterial buried below a location where the antenna is located. Theresonant frequency is correlated to a resonant atom of the molecule andone or more magnetic influence factors (MIF). Each MIF includes anamount of magnetic influence between the resonant atom and an atom ofthe molecule different from the resonant atom. The antenna includes awave detector configured to detect a reflected wave. Detection of thereflected wave includes detecting a downward force on the rod above athreshold. The antenna includes a timer configured to measure a timedifference between transmission of the signal and detection of thereflected wave, and a depth calculator configured to determine a depthof the material based on the time difference and a reflected velocitycorresponding to the resonant atom.

In some embodiments, the antenna includes a polarity switch configuredto cause the DC current source to transmit DC current in the coil in afirst direction at a first magnitude in response to being set to a northpolarity position and configured to cause the DC current source totransmit DC current in the coil in a second direction opposite the firstdirection and at a second magnitude in response to being set to a southpolarity. In other embodiments, the wave detector includes a springdevice with a first end connected toward a first end of the rod. Thespring device is configured to provide a spring force in an upwarddirection during transmission of the signal. A second end of the roddistal to the first end of the rod is maintained in a fixed positionallowing movement of the first end of the rod up and down and a secondend of the spring device is maintained at a location above the secondend of the spring device to maintain the rod in the horizontal position.Detection of the reflected wave causes the downward force sufficient toovercome the spring force of the spring device and move the first end ofthe rod downward. In other embodiments, the rod includes a first end anda second end distal to the first end and the wave detector includes astrain gauge connected to the second end of the rod, where detection ofthe downward force includes the strain gauge detecting a downward forceon the rod above a threshold.

Mineral signature detection (“MSD”) uses the interrelated connectionbetween three natural phenomena: nuclear magnetic spin, gravitationalwave radiation and the effect on nuclear magnetic spin and gravitationalwave radiation of the earth's magnetic field. Electromagnetic radiation(“EMR”) experiences refraction when passing from one transparentsubstance, such as water to another. For example, light passing throughwater causes the light waves of various frequencies to refract atdifferent angles causing a rainbow. Higher frequencies experiencegreater refraction. Elements emit a set of light frequencies unique tothat element. A spectrometer is an instrument used to identify anelement by observing the refraction set of emitted light frequencies.When a white light source is pointed at a refracting prism, higherfrequency light is refracted more than lower frequency light so thatpurple and blue light refract more than green, yellow and red light andappear at the bottom of refracted light while red and yellow appear atthe top of refracted light. Using a spectrometer, each type of lightsource emits a unique light pattern so that viewing a particular lightpattern is used to identify a type of light source emitting the light.The same principle may be used for detection of other materials atfrequencies outside the visible light spectrum.

Gravitational radiation waves and electromagnetic waves both travel atthe speed of light and both display similar frequency dependent waverefraction properties. Both wave types exemplify polarizedcharacteristics. While spectroscopy is a means to identify a mineralsource using light radiation, gravitational radiation using MSD is ameans to identify a mineral source using gravitational waves. Lightradiation is limited to above surface observation. Gravitationalradiation is not limited to above surface observation.

Atoms having a ground state nuclear magnetic spin create a magneticsphere of influence. FIG. 9 is a diagram 900 illustrating Larmorprecession 902 of an atom 904. Larmor precession is the precession ofthe magnetic moment of the atom nucleus in an external magnetic field.The atom nucleus with a magnetic moment also has angular momentum andeffective internal electric current proportional to their angularmomentum. When subjected to a magnetic field B, the axis 906 of an atomnucleus spins processional in a circular path like a spinning top at aparticular velocity. This velocity of is the Larmor ProcessionalFrequency and is dependent on the strength of the magnetic field B. Theatom's particle-wave nature requires it to be oriented either with oropposite to the overall direction of the magnetic field B.

Since all atoms have gravity properties, the Larmor PrecessionalFrequency of an atom also gives rise to a companion gravitationalradiation frequency of the atom. The gravitational radiation frequencylikewise is dependent on a sum of the magnetic sphere of influences onthe atoms in a molecule. The magnetic spin of atoms covalently bonded ina molecule intrinsically influence each other. Allowed orientations,combinations, and permutations of the atoms in a given molecule giverise to a unique set of gravity radiation frequencies for the molecule.

Around 2001, the inventor discovered that for the earth's magnetic fieldof 517 mG, hydrogen resonates at a Larmor Precessional Frequency of 2200hertz (“Hz”). Another resonance for water was detected at about 5600 Hz.Assuming that there was spin coupling and an assumed influence of onehydrogen atom of a water molecule to the other hydrogen molecule of thewater molecule, 2200 Hz subtracted from 5600 Hz results in 3400 Hz.Subtracting 3400 from 2200 results in −1200 where 2200 Hz is the earth'smagnetic field influence on hydrogen at the measured magnetic fieldstrength of 517 mG at the location where the test was performed.Additional testing confirmed that a hydrogen atom in a water moleculehas an intrinsic magnetic influence factor (“MIF”) of 806.13 mG on theother covalently bonded hydrogen atom of the water molecule. Thisprinciple applies to any atom with spin covalently bonded with otheratoms in a molecule.

FIG. 1 is a schematic block diagram illustrating one embodiment of alocator apparatus 100 for determining presence and depth of materials inthe earth. The locator apparatus 100 includes a rod 102, a coil 104, asignal generator 106, a direct current (“DC”) current source 108 with apolarity switch 110, a controller 112 with a transmission circuit 114, awave detector 116, a timer 118, and a depth calculator 120, a hingepoint 122 and a connector 124, which are described below.

The DC current source 108 is connected to the coil 104 and the signalgenerator 106 is connected to the rod 102 forming an antenna. For aparticular material located under a location, the controller 112 setsthe signal generator 106 to a fundamental frequency that is a resonantfrequency of a particular resonant atom. The transmission circuit 114controls the DC current source 108 to transmit a particular DC currentin the coil 104, and the transmission circuit 114 of the controller 112turns on the signal generator 106 to transmit a signal with afundamental frequency matching the resonant atom. After a time, the wavedetector 116 detects a reflected wave at the antenna. The timer 118determines a time difference between when the transmission circuit 114causes the signal generator 106 to transmit the signal and a time whenthe reflected wave is detected. The depth calculator 120 determines adepth of the material buried below the antenna based on the timedifference determined by the timer 118 and a reflected velocity valuefor the resonant atom in feet per second.

The locator apparatus 100 includes an antenna formed by a rod 102 with acoil 104 wound around the rod 102. In some embodiments, the rod 102 hasa length in a first direction that is greater than a width or depthwhere the width and depth are perpendicular to the first direction. Thecoil 104, in some embodiments, is wound around the rod 102 along thelength of the rod 102 in the first direction. In some embodiments, therod 102 is cylindrical. In other embodiments, the rod 102 is cuboid withsome rectangular or square sides. In other embodiments, the rod 102 is atriangular prism. In other embodiments, the rod 102 is of another shape.The rod 102 of the antenna is shaped so that when the coil 104 iswrapped around the rod 102 a reflected wave causes a reaction with theantenna. In some embodiments, an end of the rod 102 becomes a hingepoint 122 or fulcrum so that a reflected wave, acts on the rod 102 andcauses a force that moves an end of the rod 102 distal to the hingepoint 122 moves. In other embodiments, the antenna when in use ispositioned horizontal to the ground and the coil 104 is wound around therod 102 in a direction parallel to the ground so a force from thereflected wave coming from the ground exerts a force on the rod 102.

In some embodiments, the rod 102 is of a material that is non-ferrousand/or non-magnetic. In some examples, the rod 102 is made of anon-ferrous metal, such as brass, aluminum, silver, copper,chrome-nickel, and the like. In other embodiments, the rod 102 is madeof another material, such as plastic, wood, glass, polymers, etc. Inother embodiments, the rod 102 is weakly paramagnetic. The rod 102 isnon-magnetic or at least weakly paramagnetic to reduce magnetic fieldeffects on the rod 102. In some embodiments, the rod 102 is conductive.For example, where the rod 102 is brass, the rod 102 may better act asan antenna or a portion of an antenna for transmitting a signal.

The coil 104 is wrapped around the rod 102 and is designed to generatean electromagnetic field of a particular magnetic strength whileconnected to the DC current source 108 with a DC current transmittedthrough the coil 104. Wire of the coil 104 is designed to handle aparticular current. In some embodiments, a number of turns of wire inthe coil 104 combined with a DC current level produce a magnetic fieldstrength about equal to a magnetic field strength at a location wherethe locator apparatus 100 is used. For example, the magnetic fieldstrength may be around 524 milli-gauss (“mG”) and the turns of the coil104 and DC current may be set to produce a magnetic field strength ofaround 500 mG. In many locations in the northern hemisphere the magneticfield is in the range of about 450 mG to about 550 mG and the rod 102and coil 104 having a magnetic field strength of around 500 mG istypically sufficient. Other locations, such as around the equator or inthe southern hemisphere where the magnetic field strength is differentmay require a different number of turns of the coil 104 and/or adifferent DC current.

In a particular example, the coil 104 is wrapped with wire at 100 turnsper inch and is 4¾ inches on a 5¼ inch brass rod 102, which results inabout 475 turns. The DC current source 108 transmits a DC current in therange of about 45-65 milli-amperes (“mA”) through the coil 104 while thepolarity switch 110 is set to a “north” position so the DC currenttravels through the coil 104 in a first direction. Where the polarityswitch 110 is set to a “south” position so DC current is flowing in anopposite direction to the first direction, the DC current sourcetransmits current in a range of about 75-95 mA. In some embodiments, theDC current source is set to 55 mA in when the polarity switch 110 is setto north and 85 mA while the polarity switch is set to south.

The magnetic field strength of the antenna of the example above issufficient for many locations in north America. In other locations wherethe measured magnetic field strength differs significantly from around525 mG, the DC current in the coil 104 and/or the number of turns perinch of wire on the coil 104 may need to change to minimize effects ofthe earth's magnetic field at the location where the locator apparatus100 is used. The magnetic field strength may be determined from variouswebsites and agencies, such as the Magnetic Field Calculators webpage ofthe National Oceanic and Atmospheric Administration athttps://www.ngdc.noaa.gov. A more accurate method of determiningmagnetic field strength a location is to directly measure the magneticfield strength at the location at the time of testing. Note that themagnetic field strength varies by altitude. For example, at a particularlocation, the magnetic field strength may be 511.87 mG at ground level,which is 4800 feet (“ft”) above sea level. At a depth of 5000 feet belowground, which is 200 feet below sea level, the magnetic field strengthwould be 512.25 mG. At a depth of 10,000 feet below ground, which is5200 feet below sea level, the magnetic field strength would be 512.64mG.

FIG. 15 is a schematic block diagram illustrating a local magnetic fieldmeasuring station 1500, according to various embodiments. The localmagnetic field measuring station 1500 includes a magnetic fieldapparatus 1502 with a magnetometer 1504, a real time data collector1506, a data transmitter 1508, an XYZ probe 1510, and a broadcastantenna 1512, and a controller 112 of the locator apparatus 100 thatincludes a B-field signal receiver 1514, and a receiver antenna 1516,which are described below.

The local magnetic field measuring station 1500 is intended to be placedin proximity to where the locator apparatus 100 is being used. The localmagnetic field measuring station 1500 is placed far enough away from thelocator apparatus 100, vehicles, metallic objects, etc. to get a cleanreading of the magnetic field of the location where the locatorapparatus 100 is being used. Typically, the magnetic field does notchange much within a short distance, such as 100 yards, a 1000 yards, orthereabouts. While the earth's magnetic field is measured and publishedfor various locations, the magnetic field strength has a tendency tochange, even over the course of a day. Having the local magnetic fieldmeasuring station 1500 provide real-time adjustment of magnetic fieldstrength for the locator apparatus 100.

The local magnetic field measuring station 1500 includes a magnetometer1504 that senses the earth's magnetic field at the location of the localmagnetic field measuring station 1500. The magnetometer 1504 transmitsdata to a real time data connector 1506, which then uses a datatransmitter 1508 to transmit magnetic field readings over a broadcastantenna 1512. The controller 112 includes a B-field signal receiver 1514and associated receiver antenna 1516 that receive the magnetic fielddata transmitted from the local magnetic field measuring station 1500and use the magnetic field data to input in the depth calculator 120,which uses magnetic field strength.

In some embodiments, the depth calculator 120 include a rate limiterand/or magnetic field thresholds. The magnetic field thresholds, in someembodiments, are a particular amount above and/or below a publishedmagnetic field strength for the location. Where a rate of the magneticfield strength varies more than a rate limit or varies above or below amagnetic field threshold, the locator apparatus 100 sends an alert ortakes corrective action. In some embodiments, the corrective action maybe to reset the magnetic field strength to a known good value, to apublished value, or the like. The rate limiter and magnetic fieldthresholds provide a solution when something affects measurements ofmagnetic field strength by the local magnetic field measuring station1500.

In some embodiments, the local magnetic field measuring station 1500includes an XYZ probe 1510 connected to the magnetometer 1504 where theXYZ probe 1510 receives magnetic field strength data. The XYZ probe 1510may be placed in a particular orientation and may receive magnetic fielddata along x and y coordinates that correspond to north-south andeast-west as well as a z coordinate that corresponds to a verticalcoordinate. The XYZ probe 1510 transmits the x, y, and z vectorinformation to the magnetometer 1504, which then provides a magnitude aswell as polar coordinates or other information known to those of skillin the art. In other embodiments, the local magnetic field measuringstation 1500 does not include the XYZ probe 1510 and the local magneticfield measuring station 1500 include an internal probe that measuresmagnitude of the earth's magnetic field strength at the location of thelocal magnetic field measuring station 1500. Other embodiments, includeother ways to measure the earth's magnetic field strength at or nearwhere the locator apparatus 100 is being used.

The signal generator 106 is connected to the rod 102 and is configuredto transmit a signal that includes a fundamental frequency to the rod102. In some embodiments, the signal generator 106 is a variablefrequency signal generator capable of transmitting a signal at variousfrequencies within a range between a lowest resonant frequency and ahighest resonant frequency. For example, the signal generator 106 mayhave a range of 20 Hz to around 500 kilohertz (“kHz”). In otherembodiments, the signal generator 106 is capable of generating a signalwith a fundamental frequency in the mega-hertz or giga-hertz range. Insome embodiments, the signal generator 106 transmits a sine wave. Inother embodiments, the signal generator 106 transmits a quasi-sine wavewith a fundamental frequency as selected. In other embodiments, thesignal generator 106 transmits a square wave with a fundamentalfrequency as selected. A sine wave is generally preferred so thatharmonics of the fundamental frequency are not present or are minimized.

The signal generator 106 and/or controller 112 includes a user interfaceto allow a user to set the fundamental frequency of the signal. The userinterface may include a dial with an indicator of a selected frequency,may include a dial with a digital display of the selected frequency, mayinclude up/down buttons with a digital display of the selectedfrequency, and the like. In some embodiments, the controller 112 includea user interface, such as a digital display, and an input device, suchas a mouse, a keyboard, a touchscreen, etc. to allow a user to input adesired resonant atom and/or molecule of the material being sought andthe controller 112 sets the fundamental frequency of the signalgenerator 106. One of skill in the art will recognize other ways for thelocator apparatus 100 to include a user interface to allow a user to seta desired fundamental frequency of the signal.

The DC current source 108 is configured to transmit a DC current in thecoil 104 where DC current in the coil 104 induces an electromagneticfield of a particular polarity in the antenna and DC current in anopposite direction in the coil induces an electromagnetic field of anopposite polarity in the rod 102. The DC current source 108, in someembodiments, generates DC current in the milli-ampere range. In otherembodiments, the DC current source 108 is capable of generating a higherDC current, such as in a 0-10 ampere range. The DC current source 108,in some embodiments, is selected to generate an appropriate DC currentfor the number of turns in the coil 104 for a desired electromagneticfield strength. The DC current source 108, in some embodiments, isvariable over a desired DC current range. In other embodiments, the DCcurrent source 108 is configured to transmit discrete DC currentamplitudes.

In some embodiments, the DC current source includes a polarity switch110 that reverses DC current direction (e.g., positive to negative). Insome embodiments, the polarity switch 110 is a double-pole, double-throwswitch that reverses polarity of output terminals with respect to aparticular polarity of input terminals. In other embodiments, thepolarity switch 110 is an electronically controlled switch or relaycontrolled by the transmission circuit 114 or other switch available toa user and remote from the polarity switch 110. One of skill in the artwill recognize other polarity switches 110 that allow a user or programcode to switch polarity of DC current through the coil 104.

The controller 112 is depicted with the transmission circuit 114, thetimer 118, the depth calculator 120, and the wave detector 116. Otherembodiments of the controller 112 include one or more of the signalgenerators 106 and the DC current source 108. Other embodiments of thecontroller include less components than are depicted in FIG. 1 . Forexample, the timer 118, in some embodiments, is a separate timingcircuit that may be manually started and stopped. In other embodiments,the wave detector 116 includes a visual indication of movement of theantenna. In other embodiments, the depth calculator 120 includes aseparate device that uses a net penetration value of the resonant atommultiplied by a time difference determined by the timer 118.

In some embodiments, the controller 112 includes hardware circuits,switches, buttons, etc. The controller 112, in some embodiments, isimplemented with a VLSI circuit. In other embodiments, the controller112 is implemented with a programmable hardware device, such as a FPGA,programmable logic array, etc. In other embodiments, the controller 112includes a processor and memory and one or more components 114, 116,118, 120 of the controller 112 are partially or completely implementedwith program code stored in non-volatile computer readable storagemedia. For example, a portion of the controller 112 may include programcode that includes a timer algorithm, a depth calculator, controls fortransmitting the signal, etc. and may also include resonant frequenciesfor atoms, Larmor Precessional Frequencies, MIFs, etc. along with codeto translate various numbers for different measured magnetic fieldstrengths at various locations where the locator apparatus 100 is used.One of skill in the art will recognize other ways to implement thecontroller and which functions to include in the controller 112.

The transmission circuit 114 is configured to cause the signal generator106 to transmit the signal to the rod 102. In some embodiments, the rod102 is positioned horizontally while transmitting the signal and thefundamental frequency of the signal is a resonant frequency of amolecule of a material buried below a location where the antenna islocated. The resonant frequency correlates to a resonant atom of themolecule and one or more magnetic influence factors (“MIFs”). Each MIFincludes an amount of magnetic influence between the resonant atom andan atom of the molecule different from the resonant atom. In otherembodiments, the transmission circuit 114 causes the signal generator106 to transmit the signal to the rod 102 in response to user input. Forexample, the locator apparatus 100 may include a start button or similarmechanism and once the user presses the start button, flips a switch,etc., the transmission circuit 114 causes the signal generator 106 totransmit the signal.

In some embodiments, the transmission circuit 114 also controls the DCcurrent source 108 and turns on the DC current source 108 prior totransmission of the signal. In other embodiments, the transmissioncircuit 114 controls the magnitude of the DC current transmitted by theDC current source 108. In other embodiments, the transmission circuit114 controls the polarity switch 110.

The timer 118 is configured to measure a time difference betweentransmission of the signal and detection of the reflected wave. Thetimer 118, in some embodiments, tracks a signal from the transmissioncircuit 114 to start the timer 118 and a signal from the wave detector116 to measure when the antenna detects the reflected wave. In otherembodiments, the timer 118 is a manual timer, such as a stopwatch wherea user starts the timer 118 simultaneously with transmission of thesignal and stops the timer 118 with a visual indication of the reflectedwave moving the rod 102. In other embodiments, the wave detector 116electronically detects the reflected wave and signals the timer 118 upondetection of the reflected wave.

The wave detector 116 is configured to detect a reflected wave. In someembodiments, the wave detector 116 is configured to detect the reflectedwave by detecting a downward force on the rod 102. Downward as usedherein includes a direction toward the earth where the material beingdetected is presumed to be. In some embodiments, detecting movement ofthe rod 102 in a downward direction includes detecting downward movementof the rod sufficient to overcome a spring force in an upward directionexerted by a spring mechanism supporting the rod 102. The springmechanism, in some embodiments, is all or part of the connector 124, 124a, 124 b. As used herein, detecting downward movement of the rodsufficient to overcome a spring force in an upward direction exerted bya spring mechanism supporting the rod 102 includes a force that willenable the rod 102 to move in a downward direction. In some embodiments,detecting downward movement of the rod sufficient to overcome a springforce includes the spring force having a breakover point where adownward force due to the reflected wave is a force above a thresholdthat will cause the rod 102 to move downward past the breakover point.

In some embodiments, detecting the downward force includes detecting thedownward force on a strain gauge connected to the rod 102 above athreshold. In some embodiments, The wave detector 116 is coupled to therod 102 via a connector 124. Various embodiments of the wave detector116 are depicted in FIG. 3 and are discussed below.

The depth calculator 120 is configured to determine the depth of thematerial based on the time difference and a reflected velocitycorresponding to the resonant atom. Where the timer 118 determines aparticular time difference between transmission of the signal anddetection of the reflected wave on the antenna, the depth calculator 120uses this time difference and multiplies the time difference by areflected velocity of the resonant atom to determine the depth of thematerial. As an example, if the time difference is 30 seconds and theresonant atom is hydrogen at a reflected velocity of 15 feet per second,the depth is 30 seconds times 15 feet/second=450 feet.

Reflected velocity, as used herein, is a term given to a rate calculatedfor a particular material where the rate for a particular material isdetermined by measuring the time between transmitting the signal anddetection of a reflected wave on the antenna where the material beingsought is a known depth below where the signal is transmitted. Reflectedvelocities for materials have been derived based on measurements aboveknown deposits of various materials. For example, where silicon dioxide(sand) is known to be a certain depth below a particular location, thelocator apparatus 100 was used to measure an amount of time betweentransmission of a signal and detection of a reflected waveform. Thereflected velocity for silicon dioxide was then calculated based on themeasurements. This process has been repeated for other materials.

Note that reflected velocity varies based on the earth's magnetic fieldstrength at the location of the measurement. As the magnetic fieldstrength varies, the reflected velocity also varies. Table 1 includesreflected velocities (“RV”) for several materials. The magnetic fieldstrength was measured at 525.6 mG for a first location, which is at theGrays Lake Well CPC 17-1 in Bonneville County, Id. which has carbondioxide at a known depth of 8640 feet. The reflected velocity forseveral materials is in the RV* column at this first site for themeasured magnetic field strength of 525. mG.

The right RV* column includes adjusted reflected velocities for the samematerials. The RV* column is for a second location with a magnetic fieldstrength of 502 mG. The second location is Covenant Field Well 17-1 inSigurd, Utah where silicon dioxide is at a known depth of 5840 feet.From the reflected velocities measured at each location, Equation (1)was developed for adjustment of the magnetic field strength based on acurrent magnetic field strength reading. Equation 1 is:

$\begin{matrix}{{RV}^{*} = {\frac{\left( {B - {512.47{mG}}} \right)}{512.47{mG}*{RV}*1.517} + {RV}}} & (1)\end{matrix}$

where the magnetic field strength factor 512.47 mG and an adjustmentconstant of 1.517 percent for every one percent change in magnetic fieldstrength. B in equation (1) is a current measurement of magnetic fieldstrength.

TABLE 1 Initial and corrected reflected velocities RV B = RV* B = RV* B= Material 512.47 mG 525.6 mG 502 mG Hydrogen 15 15.58 14.54 Oxygen21.62 22.46 20.95 Silicon 27.91 28.99 27.04 Deuterium 29.18 30.31 28.28Iron 100 103.89 96.90 Carbon 694 720.97 672.49

In other embodiments, the depth calculator 120 determines a thickness ofthe material by determining a depth of the bottom of the layer ofmaterial and subtracting the depth at the top of the layer of materialfrom the depth at the bottom of the layer of material. For example,where the depth of the top of the layer of material is 450 feet and asecond signal is transmitted at a second location as explained belowwith respect to FIG. 2 and it takes 31 seconds to detect a secondreflected wave then the depth to the bottom of the layer of material is465 feet so the depth calculator 120 determines that the thickness of 15feet.

FIG. 2 is a schematic block diagram 200 illustrating using the locatorapparatus 100 of FIG. 1 to determine presence and depth of materials inthe earth. The diagram 200 includes a ground level 202, a layer of oil204 (“oil 204”), other layers 206, an oil derrick 208, an oil shaft 210,a house 212, a tree 214, a first MSD apparatus (“MSD1”), a second MSDapparatus (“MSD2”), a first signal 216, a first reflected wave 218, asecond signal 220, a second reflected wave 222, and a wave cone 224,which are described below. Note that the oil layer 204 may be anyhydrocarbon, such as crude oil, methane, propane, etc.

MSD1, in some embodiments, is a first device that includes the locatorapparatus 100 and MSD2 is a second device that includes the locatorapparatus 100. The diagram 200 includes a ground level 202, which slopesup from left to right above an oil layer 204 and other layers 206 belowthe oil layer 204. The diagram 200 includes an oil derrick 208 with anoil shaft 210 drilled from the oil derrick 208 to the oil layer 204. Ahouse 212 and a tree 214 are depicted above the ground level 202 todepict any type of landscape that may include oil 204 below. MSD1 isplaced in a first location to detect the presence of oil 204 below thefirst location. The oil 204 is a hydrocarbon with at least hydrogenatoms and carbon atoms. Other atoms, molecules and impurities may bemixed in with the oil 204. MSD1 is useful to detect the presence anddepth to the top of the oil 204 and MSD2 is useful in detecting athickness of the oil layer 204.

Initially, MSD1 transmits a signal with a fundamental frequency thatmatches a resonant frequency of hydrogen or carbon in a particularsought for molecular structure. For example, the resonant atom may becarbon 13 (“C¹³”) or hydrogen. In one example, the sought for molecularstructure is methane which includes a single C¹³ atom with four hydrogenatoms covalently bonded to the C¹³ atom. For methane, the resonant atommay be chosen to be hydrogen, which includes one C¹³ atom bonded to thehydrogen atom and three hydrogen atoms bonded to the C¹³ atom, all ofwhich affect the resonant hydrogen atom. Where the hydrogen atom isselected as the resonant atom for methane, a resonant frequency isselected in the 17 kHz range. MSD1 sets the resonant frequencytransmitted by the signal generator 106 and the transmission circuit 114causes the signal generator 106 to begin transmitting the first signal216 with the resonant frequency for the hydrogen atom of methane andafter a time the wave detector 116 detects the first reflected wave 218,which confirms the presence of methane.

The timer 118 determines a time difference between transmission of thefirst signal 216 and detection of the first reflected wave 218 for usein determining a depth of the methane. The depth is to a top of themethane. Molecules often have different resonant frequencies dependingon which atom is chosen as the resonant atom and the direction of themagnetic spin on various atoms. For example, methane includes one carbonC¹³ atom and four hydrogen atoms. One resonant frequency occurs when ahydrogen atom is selected as the resonant atom while the carbon C¹³ atomand other three hydrogen atoms have a magnetic spin aligned with theearth's magnetic field. A different resonant frequency is present wherethe magnetic spin for a hydrogen atom is opposite the earth's magneticfield. Some molecules may have a same resonant frequency as othermolecules, depending on magnetic spin of atoms of the molecules. Wherefurther confirmation of detection of a particular molecule, such asmethane, is desired, MSD1 may transmit a different resonant frequency ofthe sought for molecule and detection of a reflected wave for eachtransmitted resonant frequency may then be used to further confirm thepresence of the molecule.

Detection of the first reflected wave 218 establishes presence of an oillayer 204 and the depth calculator 120 uses a time difference betweentransmission of the first signal 216 and detection of the firstreflected wave 218 to determine a depth of a top of the oil layer 204.Transmission of the first signal 216 diffracts in the oil layer 204 whenthe first signal 216 reaches the oil layer 204 to form a wave cone 224.The shape of the wave cone 224 is dependent on the fundamental frequencyof the first signal 216. The wave cone 224 terminates at a bottom of theoil layer 204. MSD2 transmits a second signal 220 at a second locationaway from the first location where MSD1 is simultaneously transmittingthe first signal 216. The second signal 220 is an opposite polarity thanthe first signal 216. For example, where the first signal 216 is a northpolarity, the second signal 220 is set to a south polarity. Where MSD2detects a second reflected wave 222, the timer 118 determines adifference between transmission of the second signal 220 and detectionof the second reflected wave 222 and the depth calculator 120 determinesthe depth of the oil 204 at the second location.

Where MSD2 detects the second reflected wave 222, MSD2 is moved furtheraway from the first location and transmits the second signal 220 again.The second location is adjusted until MSD2 is no longer able to detectthe second reflected wave 222. At this point, MSD2 is moved shortdistances toward the first location until the second reflected wave 222is again detected, which is at or close to where the wave cone 224terminates at the bottom of the oil layer 204. The depth calculator 120then determines a depth of the bottom of the oil layer 204. The depthcalculator 120 then determines a thickness of the oil layer 204 from thecalculated depth of the top of the oil layer 204 and the calculateddepth of the bottom of the oil layer 204. Note that experimentation hasshown that while MSD1 is transmitting the first signal 216, placement ofMSD2 beyond the wave cone 224 will result in no detection of a secondreflected wave 222. While the wave cone 224 is ideally a perfect cone,edges of the oil layer 204 and depth variations of the top and bottom ofthe oil layer 204 affect the shape of an actual wave cone 224.

FIG. 3 is a schematic block diagram illustrating another embodiment 300of the locator apparatus 100 of FIG. 1 with various ways to determinepresence of a reflected wave after a signal has been sent. In theembodiment, the rod 102 and coil 104, the controller 112, signalgenerator 106 and DC current source 108 are depicted in an enclosure302. In one embodiment, the hinge point 122 is as depicted and theconnector 124 a is a spring device with a spring-like function and isconnected to a fixed element 304 a. In the embodiment, the hinge point122 may be a hinge or something similar that is anchored the fixedelement 304 a that extends down to at least the hinge point 122. In someembodiments, the fixed element 304 a is a vertical support, such as apost, a frame, or other device that is connected to the connector 124 aas a spring device and serves as an anchor for a hinge or similar deviceat the hinge point 122.

Note that while the hinge point 122 is depicted at the bottom leftcorner of the enclosure 302, the hinge point 122 may be along the leftedge of the enclosure 302, at the top left corner of the enclosure,along the bottom edge of the enclosure 302 toward the left side, alongthe top edge of the enclosure 302 toward the left edge, etc. The hingepoint 122 may be placed anywhere on the enclosure 302 that will serve toallow a reflected wave to be a downward force on the enclosure 302 in away that will allow measurement of the force or movement of theenclosure 302 or portions of the enclosure 302 to the right of the hingepoint 122.

In embodiments where the connector 124 is a spring device, the connector124 may be a spring, an elastic cord, or similar material that providesa spring force against movement of a right side of the enclosure 302 ina downward direction while the hinge point 122 is fixed. In theembodiment, the spring device (e.g., connector 124) has a spring forcethat balances weight of the locator apparatus 100 and is responsive tothe reflective wave such that the enclosure 302 moves downward about thehinge point 122. In some embodiments, the fixed element 304 a supportinga top end of the connector 124 is positioned to allow a breakover pointwhere movement of the right side of the enclosure 302 in the downwarddirection past the breakover point allows a reduced spring force on theconnector 124 so the right side of the enclosure 302 drops down untilbeing pulled up to a horizontal position. In some embodiments, the fixedelement 304 a and hinge point 122 are held by a user. In otherembodiments, the fixed element 304 a and hinge point 122 are mounted toa device held by a user.

In other embodiments, the connector 124 a is a cable, rope, string, etc.and does not have an intentional spring force and the wave detector 116is a device that measures force, such as a strain gauge and is connectedat some point in line with the connector 124 a and measures force on theenclosure 302 caused by the reflected wave interacting with the antennain the enclosure 302. The strain gauge may be in or at the enclosure 302and connected to an end of the connector 124 a, may be connected to orlocated within the fixed element 304 a, or may be in line with theconnector 124 a.

In other embodiments, the connector 124 is a connector 124 b positionedvertically to fixed element 304 b located above right side of theenclosure 302. Again, the connector 124 b may include a spring device ormay be a cable, cord, etc. and the wave detector 116 may include astrain gauge. Again, the strain gauge may be in or at the enclosure 302and connected to an end of the connector 124 b, may be connected to orlocated within the fixed element 304 b, or may be in line with theconnector 124 b.

In another embodiment, the enclosure 302 may be connected to a support306 that includes a device to measure force on the enclosure 302, suchas a strain gauge. In the embodiment, the support may be connected to afixed element 308, such as a post, a frame, etc. One of skill in the artwill recognize other ways for the wave detector 116 to detect areflected wave.

FIG. 4 is a schematic block diagram illustrating another locatorapparatus 400 for determining presence and depth of materials in theearth, according to various embodiments. The locator apparatus 400includes a rod 102, a coil 104, a signal generator 106, a direct current(“DC”) current source 108 with a polarity switch 110, a controller 112with a transmission circuit 114, a wave detector 116, a timer 118, and adepth calculator 120, a hinge point 122 and a connector 124, which aresubstantially similar to those described above in relation to thelocator apparatus 100 of FIGS. 1-3 . In various embodiments, the locatorapparatus 400 includes a thickness calculator 402, a depth module 404, aresonant frequency change module 406, a resonant frequency calculator408, an MIF module 410, and/or a reflected velocity module, which aredescribed below.

In some embodiments, the locator apparatus 400 includes a thicknesscalculator 402 configured to determine a thickness of the material bysubtracting the depth of the top of the material and the depth of thebottom of the material. The thickness calculator 402 is configured to beused with a second locator apparatus 400 (e.g., second MSD apparatusMSD2) as depicted in FIG. 2 where a second depth calculator 120determines a depth to the bottom of the material. In some embodiments,the thickness calculator 402 uses a depth to the top of the materialfound by a first depth calculator 120 of a first locator apparatus 400(e.g., a first MSD apparatus MSD1) and a depth to the bottom of thematerial found by a second depth calculator 120 in the second locatorapparatus 100/400 (e.g., MSD2). In other embodiments, the thicknesscalculator 402 subtracts a first time difference found by the firstlocator apparatus 100/400 from a second time difference found by thesecond locator apparatus 400 to find a first/second time difference andthen multiplies the first/second time difference by a reflected of thematerial to find the thickness of the material.

In some embodiments, the locator apparatus 400 includes depth module 404configured to adjust the magnetic field strength B at the location tocorrespond to a depth below the location. In some instances, the wavedetector 116 may fail to detect a reflected wave due to a change inmagnetic field strength differences between the magnetic field strengthat the surface at the location and the magnetic field strength at thedepth of the material, as described in more detail with regard to themethod 500 of FIGS. 5A and 5B. Where the wave detector 116 fails todetect a reflected wave, the depth module 404 adjusts the magnetic fieldstrength B to another depth below the surface at the location.

In some embodiments, the locator apparatus 400 includes a resonantfrequency change module 406 configured to change the resonant frequencyto an adjusted resonant frequency based on the resonant frequencyequation (2) and the adjusted magnetic field strength B, supplied by thedepth module 404, for the depth below the location. The transmissioncircuit 114 then transmits transmit an adjusted signal from the antennaat the location. The adjusted signal includes an adjusted fundamentalfrequency where the adjusted fundamental frequency is based on theadjusted resonant frequency from the resonant frequency change module406. The wave detector 116 attempts to detect a reflected wave on theantenna. Where the wave detector 116 does not detect a reflected wave,the depth module 404 tries another depth and determines the magneticfield strength B at the location and the resonant frequency changemodule 406 then changes the resonant frequency for the transmissioncircuit 114 to again transmit another adjusted signal. The processrepeats until either the wave detector 116 detecting a reflectedwaveform or exhausting attempts to detect a reflected waveform.

In some embodiments, the locator apparatus 400 includes a resonantfrequency calculator 408 configured to calculate the known resonantfrequency based on the resonant frequency equation (2). The resonantfrequency calculator 408 includes, in some embodiments, equation (2).The resonant frequency calculator 408, in some embodiments, includes aninput function to input magnetic field strength B, such as from amagnetometer (e.g., magnetometer 1504 of FIG. 15 ), from user input,from a table, from a database, from a magnetic field calculator, or thelike. In some embodiments, the resonant frequency calculator 408includes Larmor Precessional Frequencies of various atoms and/or anability to receive a Larmor Precessional Frequency of an atom. In someembodiments, the resonant frequency calculator 408 includes an MIF ofvarious atoms of molecules for various spins and is able to sum MIFs ofvarious atoms, depending on a particular resonant atom of a molecule.One of skill in the art will recognize other inputs, equations,databases, etc. for the resonant frequency calculator 408 to calculate aresonant frequency of a resonant atom being sought by the locatorapparatus 400.

In some embodiments, the locator apparatus 400 includes an MIF module410 configured to calculate the MIF between the different atom and theresonant atom of a molecule of a material at a location with thematerial at a known depth using a determined magnetic field strength atthe test location, a Larmor Precessional Frequency of the resonant atom,the resonant frequency corresponding to the maximum magnitude of thereflected wave, and the resonant frequency equation. The MIF module 410is used when trying to determine the MIF of a molecule, as describedbelow with regard to the methods 700, 800 of FIGS. 7 and 8 .

In some embodiments, the reflected velocity corresponding to thematerial is an adjusted reflected velocity, and the locator apparatus400 includes a reflected velocity module 412 configured to adjust thereflected velocity based on a measurement of magnetic field strength, bya magnetometer 1504, at the test location based on equation (1).Adjusting reflected velocity is described in more detail above withrespect to the depth calculator 120.

FIG. 5 is a schematic flowchart diagram illustrating one embodiment of amethod 500 for determining presence and depth of materials in the earth.The method 500 begins and transmits 502 a signal from an antenna at alocation. The signal includes a fundamental frequency and the signalpenetrates ground under the location. The location is selected to locatea material at a depth under the location and the fundamental frequencymatches a known resonant frequency of a resonant atom of a molecule ofthe material. The method 500 detects 504 a reflected wave on the antennaand determines 506 a time difference between transmission of the signaland detection of the reflected wave on the antenna. The method 500determines 508 the depth of the material based on the time differenceand a reflected velocity corresponding to the resonant atom, and themethod 500 ends. In various embodiments, the method 500 is implementedusing one or more of the rod 102, the coil 104, the signal generator106, the DC current source 108, the transmission circuit 114, the wavedetector 116, the timer 118 and the depth calculator 120.

FIG. 6A is a first part and FIG. 6B is a second part of a schematicflowchart diagram illustrating another embodiment of a method 600 fordetermining presence and depth of materials in the earth. The method 600is similar to what is depicted in FIG. 2 . The method 600 begins andtransmits 602 a first signal 216 from a first antenna (e.g., MSD1) at afirst location. The first signal 216 includes a fundamental frequencyand the first signal 216 penetrates ground under the first location. Thefirst location is selected to locate a material (e.g., 204) at a depthunder the first location and the fundamental frequency matches a knownresonant frequency of a resonant atom of a molecule of the material. Themethod 600 determines 604 if a first reflected wave 218 is detected onthe first antenna. If the method 600 determines 604 that a firstreflected wave is detected, the method 600 determines 606 a first timedifference between transmission of the first signal 216 and detection ofthe first reflected wave 218 on the first antenna. The method 600determines 608 the depth of the material (e.g., 204) based on the firsttime difference and a reflected velocity corresponding to the resonantatom.

The method 600 transmits 610 (follow “A” on FIG. 6A to “A” on FIG. 6B) asecond signal 220 from a second antenna (e.g., MSD2) located a distancefrom the first antenna. The second signal 220 includes the fundamentalfrequency and the second antenna is set to an opposite magnetic polarityas the magnetic polarity of the first antenna. The method 600 determines612 if a second reflected wave 222 is detected. If the method 600determines 612 that a second reflected wave 222 is detected, the method600 moves 614 the second antenna further from the first location andagain transmits 610 the second signal 220. If the method 600 determines612 that a second reflected wave 222 is not detected, the method 600moves 616 back to where the second reflected wave 222 is not detected.In various embodiments, the user may move 614, 616 the second antennaback and forth to more accurately detect an edge of the wave cone 224and then moves 616 toward the first location just enough to detect thesecond reflected wave 222.

The method 600 determines 618 a second time difference betweentransmission of the second signal 220 and detection of the secondreflected wave 222 on the second antenna and determines 620 a depth of abottom of the material based on the second time difference and thereflected velocity corresponding to the resonant atom. The method 600determines 622 a thickness of the material by subtracting the depth ofthe top of the material and the depth of the bottom of the material, andthe method 600 ends.

If the method 600 determines 604 that the first reflected wave is notdetected, the method 600 adjusts 624 a magnetic field strength B at thelocation to correspond to a depth below the location. Magnetic fieldstrength B varies based on depth below a surface of a location. TheNational Oceanic and Atmospheric Administration (“NOAA”) publishes awebpage that includes a magnetic field calculator at:(https://www.ngdc.noaa.gov/geomag/calculators/magcale.shtml?useFullSite=true#igrfwm)(last visited Jun. 16, 2022) that provides magnetic field strengths atvarious locations at various locations above or below sea level. In someembodiments, magnetic field strength is used to determine a resonantfrequency of the resonant atom as described below with regards toequation (2). Changes in the magnetic field strength B affect theresonant frequency of the resonant atom.

For example, Table 2 includes magnetic field strengths from the NOAAmagnetic field calculator webpage for Stevensville, Mont. at the zipcode 59870. Table 2 includes magnetic field strength B in milli Gauss(“mG”), elevation, depth below the listed elevation, change in themagnetic field strength (B Change), change factor per 5000 feet of depth(A+mG/5K ft Depth), and the date the NOAA magnetic field calculator wasaccessed. Table 3 includes magnetic field strengths from the NOAAmagnetic field calculator webpage for the CPC Well 17-1 at Grays Lake,Idaho and type of information in the columns of Table 3 are the same asfor Table 2.

TABLE 2 Magnetic Field Strength at Stevenson, Montana Δ + mG/ B mGElevation Depth B Change 5K ft Depth Date 537.33 3300 0 Jun. 16, 2022537.74 −1700 5000 0.41 0.00076303 Jun. 16, 2022 538.15 −6700 10000 0.820.00076303 Jun. 16, 2022 538.56 −11700 15000 1.23 0.00076303 Jun. 16,2022 538.97 −16700 20000 1.64 0.00076303 Jun. 16, 2022 539.38 −2170025000 2.05 0.00076303 Jun. 16, 2022 539.79 −26700 30000 2.46 0.00076303Jun. 16, 2022

TABLE 3 Magnetic Field Strength at CPC Well 17-1 at Grays Lake, IdahoΔ + mG/ B mG Elevation Depth B Change 5K ft Depth Date 524.53 6417 0Jun. 16, 2022 524.93 1417 5000 0.40 0.00076259 Jun. 16, 2022 525.33−3583 10000 0.80 0.00076259 Jun. 16, 2022 525.73 −8583 15000 1.200.00076259 Jun. 16, 2022 526.13 −13583 20000 1.60 0.00076259 Jun. 16,2022 526.53 −18583 25000 2.00 0.00076259 Jun. 16, 2022 526.93 −2358330000 2.40 0.00076259 Jun. 16, 2022

As can be seen from Tables 2 and 3, the magnetic field strength variesby depth. In addition, the amount of change for each 5000 feet incrementis slightly different for each location. In one embodiment, the method600 uses the NOAA magnetic field calculator to determine magnetic fieldstrength B for each depth below ground level at the location where thesignal is transmitted 602. Note that the NOAA field calculator valuesare updated on a periodic basis but are often different than measuredmagnetic field strength at a particular location. In other embodiments,the magnetic field strength B is measured at the location and a magneticfield difference is calculated between values from the NOAA magneticfield calculator and the actual measurement. Magnetic field strength isthen determined using the NOAA magnetic field calculator webpage forvarious depths and the magnetic field difference is applied to themagnetic field strengths at the various depths to determine moreaccurate magnetic field strengths at the location at the various depths.

In other embodiments, a database other embodiments, a database differentthan the NOAA field strength calculator is used. In some embodiments, adatabase is constructed using measured magnetic field strengths and isused to determine magnetic field strengths at a chosen location atdifferent depths. In other embodiments, equations are used to adjustmagnetic field strength at various depths based on a known or calculateddepth factor. Note that the change factor per 5000 feet (Δ+mG/5K ftDepth) in Tables 2 and 3 have different values for the differentlocations of Tables 2 and 3. Other locations have different changesfactors as well.

In some embodiments, a change factor is determined for a location fromthe NOAA magnetic field calculator and then applied to a measuredmagnetic field at the location to determine different magnetic fieldstrengths at the location. In other embodiments, a change factor isdetermined using another magnetic field calculator or by measurementsand then applied to the measured magnetic field at the location todetermine different magnetic field strengths at the location. One ofskill in the art will recognize other ways to determine magnetic fieldstrengths at various depths at a location.

The method 600 changes 626 the resonant frequency to an adjustedresonant frequency based on the resonant frequency equation (2) and theadjusted magnetic field strength B for the depth below the location andtransmits 628 an adjusted signal from the first antenna at the location.The adjusted signal is an adjusted fundamental frequency where theadjusted fundamental frequency is based on the adjusted resonantfrequency from equation (2). In some embodiments, the method 600accesses a magnetic field calculator via network connection, accesses alocal magnetic field strength database, accesses equations, etc. toadjust 624 the magnetic field strength B at the location to correspondto a depth below the location in real time and then changes 626 theresonant to the adjusted resonant frequency in real time just prior totransmitting 628 the adjusted signal. In the embodiments, the locatorapparatus 100 includes code, circuitry, etc. to receive a measuredmagnetic field strength at or near the location, to adjust the magneticfield strength B, to change 626 the resonant frequency, and/or totransmit 628 the adjusted signal.

The method 600 attempts 630 to detect a reflected wave on the firstantenna. The method 600 determines 632 if a reflected wave is detected.If the method 600 determines 632 that a reflected wave is detected atthe first antenna, the method 600 returns and determines 606 a firsttime difference between transmission of the first signal 216 anddetection of the first reflected wave 218 on the first antenna. If themethod 600 determines 632 that a reflected wave is not detected, themethod 600 determines 634 if a number of attempts has been exhausted. Insome embodiments, the number of attempts may be based on a certainnumber of changes in depth within a range. In other embodiments, a usermay determine when the number of attempts is exhausted after tryingvarious depths. One of skill in the art will recognize how to determineif the number of attempts is exhausted.

If the method 600 determines 634 that the number of attempts has notbeen exhausted, the method 600 adjusts 636 a depth (e.g., 5000 feetbelow ground to 10,000 feet below ground) and returns and adjusts 624the magnetic field strength B at the location to correspond to a depthbelow the location. If the method 600 determines 634 that the number ofattempts has been exhausted, the method 600 ends. In variousembodiments, the method 600 is implemented using the rod 102, the coil104, the signal generator 106, the DC current source 108, the polarityswitch 110, the transmission circuit 114, the wave detector 116, thetimer 118 the depth calculator 120, the thickness calculator 402, thedepth module 404, the resonant frequency change module 406, the resonantfrequency calculator 408, and/or the MIF module 410.

FIG. 7 is a schematic flowchart diagram illustrating one embodiment of amethod 700 for determining a magnetic influence factor. The method 700begins and determines 702 a current magnetic field strength at a testlocation above a quantity of material buried at the test location. Forexample, the method 700 may determine 702 the magnetic field strengththrough measurement or access to a website that lists the magnetic fieldstrength at the test location. The method 700 transmits 704 a testsignal from an antenna at the test location. The test signal is a testfundamental frequency while trying to identify a fundamental frequencyof a resonant atom of a molecule of the material.

The method 700 detects 706, at the test location, a reflected wave thatincludes the test fundamental frequency on the antenna. The method 700varies 708 the test fundamental frequency while retransmitting the testsignal and detecting a reflected wave until reflected waves of varioustest frequencies are detected and identifies 710 from the detectedreflected waves a resonant frequency corresponding to a maximummagnitude of the detected reflected waves. The material includesmolecules with the resonant atom and at least one atom different thanthe resonant atom. The resonant frequency corresponds to magneticinfluence factor (“MIF”) between the different atom and the resonantatom of the molecule of the material.

The method 700 calculates 712 the MIF between the different atom and theresonant atom using the determined magnetic field strength at the testlocation, a Larmor Precessional Frequency of the resonant atom, theresonant frequency corresponding to the maximum magnitude of thereflected wave, and a resonant frequency equation. The MIF on theresonant atom can be calculated from the following resonant frequencyequation:

RF=|(B+MIF)L|  (2)

where:

-   -   RF is the resonant frequency that corresponds to the maximum        magnitude of the reflected wave;    -   B is the earth's magnetic field strength at the test location;        and    -   L is a Larmor Precessional Frequency for the resonant atom.

In equation (2), whether or not the MIF is positive or negative dependson whether or not the spin of the atom different from the resonant atomis aligned with the magnetic field of the earth. Each atom may have aspin that may be aligned in the same direction or opposite as themagnetic field of the earth. FIG. 10 is a diagram illustrating threespin orientations for a water molecule. The first diagram on the left isfor a resonant atom of hydrogen on the left with no spin for the oxygenatom in the center and a positive spin for the hydrogen atom on theleft. Where an atom has no spin, there is no magnetic influence on otheratoms of a molecule. Where a signal with a proper resonant frequencyreaches the molecule, the spin of the hydrogen atom on the leftswitches, which is indicated by the arrow on the left hydrogen atom onthe top portion of the first diagram switching so the arrow is pointeddown on the resonant hydrogen atom.

While there is no spin for the oxygen atom, the hydrogen atom has apositive spin, meaning that the magnetic moment caused by the spinaligns with the earth's magnetic field. In water, it can be expectedthat there are some water molecules that are configured as in the firstdiagram in FIG. 10 . It can also be expected that at least some watermolecules will be configured as in the second diagram in FIG. 10 andthat at least some water molecules have an oxygen atom with spin alongwith spin of the hydrogen atom as depicted on the third diagram on theright of FIG. 10 . Not all possible spin combinations are depicted inFIG. 10 . Each configuration results in a different resonant frequency.

In one experiment, the magnetic field strength of 512.0 mG was measuredabove a known source of water. For the first diagram in FIG. 10 with nospin on the oxygen atom and a positive spin orientation of the hydrogenatom on the left, which is when the spin matches the earth's magneticfield orientation (arrow labeled “B”), a resonant frequency of 5,612.27Hz was identified using the method 600 to find the resonant frequency.The Larmor Precessional Frequency for hydrogen is 4.25775 Hz/mG.Rearranging equation (2):

$\begin{matrix}{\frac{RF}{L} = {❘{B + {MIF}}❘}} & (3)\end{matrix}$

Then for hydrogen for the spin orientations of the first diagram of FIG.10 , the MIF is determined as (5,612.27 Hz)/(4.25775 Hz/mG)=|512.0mG+806.13|=1318.13 mG. Where the spin of the hydrogen atom on the rightis opposite, as depicted in the second diagram of FIG. 10 , then the MIFis −806.13, which is derived from −(1252.33 Hz)/(4.25775 Hz/mG)=|512.0mG−806.13|=294.13 mG. This is due to the magnetic influence of thehydrogen atom being opposite the earth's magnetic field and identifies asecond resonant frequency, 1252.33 Hz. For each frequency associatedwith the atom MIF aligned with B, there will always be a secondfrequency associated with that MIF oriented opposite to the earthmagnetic field. For a water molecule, oxygen may have a magnetic spinoriented with B and a discovered resonant frequency of 9737.43 impliesan MIF of 968.86 mG for oxygen: (9737.43 Hz)/(4.25775Hz/mG=|520+806.13+968.86|=2286.99 mG.

Taking the absolute value of the terms on the right side of equation (2)is appropriate to always have a positive frequency. Note that in theabove examples the first step began by finding the 5612.27 Hz resonantfrequency and confirming the 806.13 mG where the hydrogen atom is theresonant atom. Next, the MIF was verified as correct by finding the1252.13 Hz resonant frequency for the opposite orientation of thehydrogen MIF. This known information makes it possible to find a thirdresonant frequency at 9737.43 Hz and confirms the oxygen MIF on theresonant atom hydrogen to be 968.86 mG.

FIG. 8 is a schematic flowchart diagram illustrating another embodimentof a method 800 for determining a magnetic influence factor. The method800 is similar to the method 700 of FIG. 7 but includes a way to use apreviously calculated MIF to determine another MIF. Equation (2) isapplicable to molecules with multiple atoms of various spins. The MIF ofeach atom with respect to the resonant atom must be determined andsummed, as discussed below with regard to equation (4). In variousembodiments, all or a portion of the method 700 is implemented using therod 102, the coil 104, the signal generator 106, the DC current source108, the polarity switch 110, the transmission circuit 114, the wavedetector 116, the timer 118 the depth calculator 120, the thicknesscalculator 402, the depth module 404, the resonant frequency changemodule 406, the resonant frequency calculator 408, and/or the MIF module410.

The method 800 begins and determines 802 a current earth magnetic fieldstrength at a test location above a quantity of material buried at thetest location. The method 800 transmits 804 a first test signal from anantenna at the test location. The first test signal is a testfundamental frequency while trying to identify a first fundamentalfrequency of a resonant atom of a molecule of the material.

The method 800 detects 806, at the test location, a first reflected wavethat includes the first test fundamental frequency on the antenna. Themethod 800 varies 808 the first test fundamental frequency whileretransmitting the first test signal and detecting a first reflectedwave until first reflected waves of various first test frequencies aredetected and identifies 810 from the detected first reflected waves afirst resonant frequency corresponding to a maximum magnitude of thedetected first reflected waves. The material includes molecules with theresonant atom and at least one atom different than the resonant atom.The resonant frequency corresponds to a first MIF between the differentatom and the resonant atom of the molecule of the material.

The method 800 calculates 812 the first MIF between the different atomand the resonant atom using the determined magnetic field strength atthe test location, a Larmor Precessional Frequency of the resonant atom,the first resonant frequency corresponding to the maximum magnitude ofthe first reflected wave, and a resonant frequency equation, which maybe equation (2).

The method 800 transmits 814 a second test signal from the antenna atthe test location. The second test signal has a second test fundamentalfrequency corresponding to a combination of two or more atoms and/ormagnetic spins of the two or more atoms of the molecule of the materialdifferent than the combination of two or more atoms and/or magneticspins of the two or more atoms assumed for determining a first resonantfrequency. For example, the third diagram of FIG. 10 assumes a positivespin orientation of the oxygen so a different resonant frequency willresult from equation (2).

The method 800 detects 816, at the test location, a second reflectedwave with the second test fundamental frequency on the antenna. Themethod 800 varies 818 the second test fundamental frequency whileretransmitting the second test signal and detecting a second reflectedwave until second reflected waves of various second test fundamentalfrequencies are detected and the method 800 identifies 820 from thedetected reflected waves a second resonant frequency corresponding to amaximum magnitude of the detected second reflected waves. The secondresonant frequency corresponds to a summed magnetic influence factor(“ΣMIF”) between the different atoms and the resonant atom of themolecule of the material.

The method 800 calculates 822 the ΣMIF between the different atoms andthe resonant atom using the determined magnetic field strength at thetest location, a Larmor Precessional Frequency of the resonant atom, thesecond resonant frequency corresponding to the maximum magnitude of thesecond reflected wave, each MIF for each atom of the molecule differentthan the resonant atom and the resonant frequency equation:

RF=|(B+ΣMIF)L|  (4)

For the third diagram of FIG. 10 , a resonant frequency of 9737.43 Hzwas found and the ΣMIF would be the summation of the MIF for hydrogen of806.13 plus the sought for MIF of the oxygen atom. The MIF for theoxygen atom is calculated from the equation:

$\begin{matrix}{\frac{RF}{L} = {❘{B + {MIF}_{H} + {MIF}_{O}}❘}} & (5)\end{matrix}$

Substituting numbers into equation (5) results in (9,737.43 Hz)/(4.25775Hz/mG)=|512.0 mG+806.13+MIF_(O)|=2286.99 mG and we find the MIF_(O) foroxygen to be 986.86 mG. Thus, the method 800 of FIG. 8 may be used toderive various unique MIFs for specific atoms in various molecularconfigurations of various materials. However, the magnetic influence ofatoms on a resonant atom depend on how far the atoms are away from theresonant atom. Experimentation has shown that atoms closer to theresonant atom have a stronger magnetic influence than atoms furtheraway. Experimentation has also shown that atoms more than two steps awayfrom the resonant atom do not have any appreciable effect on the totalMIF or on the resonant frequency for that configuration. In addition,experimentation has shown that for hydrogen, the magnetic influencefactor is the same for an atom one step away from the resonant atom ortwo steps away from the resonant atom. In various embodiments, all or aportion of the method 800 is implemented using the rod 102, the coil104, the signal generator 106, the DC current source 108, the polarityswitch 110, the transmission circuit 114, the wave detector 116, thetimer 118 the depth calculator 120, the thickness calculator 402, thedepth module 404, the resonant frequency change module 406, the resonantfrequency calculator 408, and/or the MIF module 410.

FIG. 11 is a table illustrating magnetic influence factors and otherinformation for various configurations of molecules of oil and quartz(silicon dioxide). The MIF values in the table of FIG. 11 are intrinsicunique values for the given molecular structure and are independent ofthe measured magnetic field strength of the earth at any location. Thevalues in the table for FIG. 11 are for a specific measured magneticfield strength of the earth at a particular location. Note that therethe last two columns are MIF₁ and MIF₂ where the first column MIF₁ isfor atoms adjacent to the resonant atom and the second column MIF₂ isfor atoms that are two steps away from the resonant atom. Note that foroil, the MIF in both of the last two columns for hydrogen is 828.74while the carbon atoms have different values for the first column MIF₁and the second column MIF₂. Silicon dioxide does not have values in thesecond column MIF₂ because there are no atoms that are two steps fromthe resonant atom.

FIG. 12 is a diagram illustrating spin orientations for two molecules.The first diagram on the left is for a molecule of methane and includesa carbon atom surrounded by four hydrogen atoms. The hydrogen atom onthe left in the first diagram is the resonant atom while the carbon atomand three other hydrogen atoms have a positive spin (arrows facing up).The formula for the summation of MIFs would be 3*H+CN where H is the MIFfor hydrogen and CN is the MIF for a single step from the resonant atom(e.g., Carbon near). In an experiment, the measured magnetic fieldstrength is 512.00 and a resonant frequency was found to be 17,073.8 Hzwhere hydrogen is the resonant atom. The MIF for hydrogen was found tobe 828.74 mG and for carbon 13 was found to be 1,011.84 mG and applyingthe MIF summation formula of 3*H+CN results in 3*828.74 mG+1,011.84mG=3,498.06 mG. Equation (2): (512.00 mG+3,498.06 mG)(4.25775Hz/mG)=17,073.8 Hz, which is the determined resonant frequency.

For the second diagram of FIG. 12 , the depicted hydrocarbon moleculeincludes five carbon atoms and 10 hydrogen atoms. The carbon atom on theleft is a carbon 12 atom with no spin. The center carbon atom is theresonant atom. The hydrogen atoms on the left and right carbon atoms donot include an arrow or line because they are three steps away from theresonant carbon atom so their MIF is not included. The carbon atomsecond from the left has hydrogen atoms that have opposite spins. Theresultant MIF formula is then 2CN+CD+4H. CN is for the carbon atoms nextto the resonant carbon atom. CD is for the carbon atom on the right thatis two steps from the resonant carbon atom. There are only 4 hydrogenMIFs included because two hydrogen atoms with opposite spin cancel eachother. In an experiment, the measured magnetic field strength is 512.00and a resonant frequency was found to be 7,255.1 Hz where carbon is theresonant atom. The MIF for hydrogen is again 828.74 mG, MIF₁ for carbonwith carbon being the resonant atom is 989.78 mG and MIF₂ is 968.6 mG.Applying the MIF summation formula of 2CN+CD+4H results in 2*989.78mG+968.6 mG+4*828.74 mG=6,263.12 mG. Equation (2) results in (512.00mG+6,263.12 mG)(1.07084 Hz/mG)=7,255.1 Hz, which is the determinedresonant frequency.

FIG. 13 is a table illustrating magnetic influence factors and frequencyinformation for various orientation options of silicon dioxide atB=524.0 mG. FIG. 14 is a schematic block diagram illustrating variouscombinations of magnetic spin of a resonant atom and related atoms forthe table of FIG. 13 . For the information in the top table, themeasured magnetic field strength from the earth is 524.0 mG.

Line 1 of the top table in FIG. 13 has a resonant atom of oxygen and anMIF formula of −S+O. The first diagram of FIG. 14 has a negative spinfor silicon (the larger circle) and a positive spin for the oxygen atomon the right where the left oxygen atom is the resonant atom. From theinformation in the top line of the top table in FIG. 13 along with theMIF information from the middle table in FIG. 13 , equation (2) can beapplied to verify the resonant frequency of the molecule in the topline. Applying the MIF formula of −S+O, the summed MIF is −1068.41mG+937.60 mG=−130.81. Applying equation (2): 1(524.0−130.81)(0.57742Hz/mG)|=227.0 Hz. Each of the MIF equations of the top table in FIG. 13is represented graphically in FIG. 14 where the row numbers in the toptable of FIG. 13 are the same as the diagram numbers in FIG. 14 .

The RV column of the top table in FIG. 13 is the atom specific,reflected velocity in feet per second. The reflected velocities of theRV column are used in the methods 500, 600 of FIGS. 5 and 6 to determinethe depth of the top and bottom of the material. The RT/S column of thetop table in FIG. 13 is the required relaxation time in seconds beforererunning a test at a location. Once a test is completed and the signalis turned off, the user must wait the amount of time in the RT/S columnbefore starting another test. The P/V F/M column of the top table inFIG. 13 is the penetration time, in feet per second, of the material,which is dependent on the specific material and the thickness of thematerial.

The Larmor Precessional Frequency for each atom is a constant value. Fora particular resonant atom of a molecule, the MIF is also constant sothe resonant frequency changes with the measured magnetic field at thelocation where the locator apparatus 100 is used. In some embodiments,the controller 112 includes tables with MIFs, The Larmor PrecessionalFrequencies, MIF formulas, etc., such as the tables of FIG. 13 so thatonce the earth's magnetic field is measured at a location, thecontroller 112 is able to determine the available fundamental resonantfrequencies.

In some embodiments, the locator apparatus 100 includes an electronicdisplay and an input device to allow a user to select a sought formaterial and associated configuration, a measured value for the earth'smagnetic field, to either set a resonant frequency to be used as thesignal transmitted from the antenna or to be displayed to the user canset the resonant frequency for the signal. In other embodiments, aseparate computing device with an electronic display and input meansincludes computer readable storage media with the Larmor PrecessionalFrequencies, MIF formulas, etc. and program code to allow the user toselect a material, molecule configuration, to input the measuredmagnetic field strength at the location, etc. and the user inputs theresonant frequency in the signal generator 106.

The embodiments described herein advantageously provide a way to avoiddrilling and other costly measures to locate materials in the earth. Forexample, the embodiments of the apparatuses describe herein may be usedto map out an oil field, to locate methane, propane, water, quartz,sand, or other material accurately and inexpensively.

The present invention may be embodied in other specific forms withoutdeparting from its spirit or essential characteristics. The describedembodiments are to be considered in all respects only as illustrativeand not restrictive. The scope of the invention is, therefore, indicatedby the appended claims rather than by the foregoing description. Allchanges which come within the meaning and range of equivalency of theclaims are to be embraced within their scope.

What is claimed is:
 1. A method comprising: determining a currentmagnetic field strength at a test location above a quantity of materialburied at the test location; transmitting a test signal from an antennaat the test location, the test signal comprising a test fundamentalfrequency; detecting, at the test location, a reflected wave comprisingthe test fundamental frequency on the antenna; and varying the testfundamental frequency while retransmitting the test signal and detectinga reflected wave until reflected waves of various test frequencies aredetected and identifying from the detected reflected waves a resonantfrequency corresponding to a maximum magnitude of the detected reflectedwaves, wherein the material comprises molecules with a resonant atom andat least one atom different than the resonant atom.
 2. The method ofclaim 1, wherein an equation for the resonant frequency is:RF=|(B+MIF)(L)| wherein: RF is the resonant frequency; B is a magneticfield strength at the test location; and L is a Larmor PrecessionalFrequency of the resonant atom.
 3. The method of claim 1, wherein theresonant frequency corresponds to magnetic influence factor (MIF)between the different atom and the resonant atom of the molecule of thematerial, and further comprising calculating the MIF between thedifferent atom and the resonant atom using the determined magnetic fieldstrength at the test location, a Larmor Precessional Frequency of theresonant atom, the resonant frequency corresponding to the maximummagnitude of the reflected wave, and a resonant frequency equation. 4.The method of claim 3, wherein in response to determining a MIF for eachatom of the molecule different than the resonant atom, furthercomprising: transmitting a second test signal from the antenna at thetest location, the second test signal comprising a second testfundamental frequency corresponding to a combination of two or moreatoms and/or magnetic spins of the two or more atoms of the molecule ofthe material different than the combination of two or more atoms and/ormagnetic spins of the two or more atoms assumed for determining a firstresonant frequency; detecting, at the test location, a reflected wavecomprising the second test fundamental frequency on the antenna; varyingthe second test fundamental frequency while retransmitting the secondtest signal and detecting a reflected wave until reflected waves ofvarious second test fundamental frequencies are detected and identifyingfrom the detected reflected waves a resonant frequency corresponding toa maximum magnitude of the detected reflected waves, wherein theresonant frequency corresponds to a summed magnetic influence factor(ΣMIF) between the different atoms and the resonant atom of the moleculeof the material; and calculating the MIF between the different atoms andthe resonant atom using the determined magnetic field strength at thetest location, a Larmor Precessional Frequency of the resonant atom, theresonant frequency corresponding to the maximum magnitude of thereflected wave, each MIF for each atom of the molecule different thanthe resonant atom and a resonant frequency equation:RF=|(B+ΣMIF)(L)| wherein ΣMIF is a summation of magnetic influencefactors of the atoms of the molecule of the material different from theresonant atom.
 5. The method of claim 1, wherein the antenna comprises:a rod; a coil wound around the rod; a direct current (“DC”) currentsource configured to transmit a DC current in the coil, wherein DCcurrent in the coil induces a magnetic polarity in the antenna and DCcurrent in an opposite direction in the coil induces an oppositemagnetic polarity in the rod; and a signal generator connected to therod, the signal generator transmitting the test fundamental frequency tothe rod, wherein the rod is positioned horizontally while transmittingthe test signal and detecting the reflected wave, and wherein detectingthe reflected wave comprises detecting a downward force on the rod. 6.The method of claim 1, further comprising, from a location differentfrom the test location: transmitting a signal from the antenna at thelocation, the signal comprising a fundamental frequency, the signalpenetrating ground under the location, the location being selected tolocate the material at a depth under the location, and the fundamentalfrequency matching the resonant frequency of the resonant atom of themolecule of the material; detecting a reflected wave on the antenna;determining a time difference between transmission of the signal anddetection of the reflected wave on the antenna; and determining thedepth to the material based on the time difference and a reflectedvelocity corresponding to the material.
 7. The method of claim 6,wherein the antenna is a first antenna set to a magnetic polarity, thesignal from the first antenna is a first signal, the time difference isa first time difference, and further comprising, while transmitting thefirst signal by the first antenna: transmitting a second signal from asecond antenna located a distance from the first antenna, the secondsignal comprising the fundamental frequency, the second antenna set toan opposite magnetic polarity as the magnetic polarity of the firstantenna; detecting a reflected wave on the second antenna; repeating, atvarying distances from the first antenna, transmitting the second signaland detecting a reflected wave on the second signal to find an edgelocation where a reflected wave is not detected by the second antenna;transmitting the second signal from the second antenna at a signaldetection location; detecting a reflected wave on the second antenna atthe signal detection location, the signal detection location locatednearer the first antenna than the edge location and close to the edgelocation; determining a second time difference between transmission ofthe second signal and detection of the reflected wave on the secondantenna; calculating a first/second time difference between the firsttime difference and the second time difference; and determining athickness of the material based on the first/second time difference andthe reflected velocity corresponding to the material.
 8. The method ofclaim 6, wherein the reflected velocity corresponding to the material isan adjusted reflected velocity, the adjusted reflected velocity isadjusted based on a measurement of magnetic field strength at the testlocation based on equation:${RV}^{*} = {\frac{\left( {B - {512.47{mG}}} \right)}{512.47{mG}*{RV}*1.517} + {RV}}$wherein: B is the magnetic field strength measured at the test location;and RV is a calculated reflected velocity of the material at a referencelocation with a known depth of the material.
 9. An apparatus comprising:a magnetometer configured to determine a current magnetic field strengthat a test location above a quantity of material buried at the testlocation; a transmission circuit configured to transmit a test signalfrom an antenna at the test location, the test signal comprising a testfundamental frequency; a wave detector configured to detect, at the testlocation, a reflected wave comprising the test fundamental frequency onthe antenna; and a depth calculator configured to vary the testfundamental frequency while the transmission circuit retransmits thetest signal and the wave detector detects a reflected wave untilreflected waves of various test frequencies are detected and a resonantfrequency calculator is configured to identify from the detectedreflected waves a resonant frequency corresponding to a maximummagnitude of the detected reflected waves, wherein the materialcomprises molecules with a resonant atom and at least one atom differentthan the resonant atom.
 10. The apparatus of claim 9, wherein anequation for the resonant frequency is:RF=|(B+MIF)(L)| wherein: RF is the resonant frequency; B is a magneticfield strength at the test location; and L is a Larmor PrecessionalFrequency of the resonant atom.
 11. The apparatus of claim 9, whereinthe resonant frequency corresponds to magnetic influence factor (MIF)between the different atom and the resonant atom of the molecule of thematerial, and further comprising an MIF module configured to calculatethe MIF between the different atom and the resonant atom using thedetermined magnetic field strength at the test location, a LarmorPrecessional Frequency of the resonant atom, the resonant frequencycorresponding to the maximum magnitude of the reflected wave, and aresonant frequency equation.
 12. The apparatus of claim 11, wherein inresponse to the MIF module determining a MIF for each atom of themolecule different than the resonant atom, wherein: the transmissioncircuit is configured to transmit a second test signal from the antennaat the test location, the second test signal comprising a second testfundamental frequency corresponding to a combination of two or moreatoms and/or magnetic spins of the two or more atoms of the molecule ofthe material different than the combination of two or more atoms and/ormagnetic spins of the two or more atoms assumed for determining a firstresonant frequency; the wave detector is further configured to detect,at the test location, a reflected wave comprising the second testfundamental frequency on the antenna; the depth calculator is furtherconfigured to vary the second test fundamental frequency while thetransmission circuit retransmits the second test signal and the wavedetector is configured to detect a reflected wave until reflected wavesof various second test fundamental frequencies are detected and aresonant frequency calculator is configured to identify from thedetected reflected waves a resonant frequency corresponding to a maximummagnitude of the detected reflected waves, wherein the resonantfrequency corresponds to a summed magnetic influence factor (ΣMIF)between the different atoms and the resonant atom of the molecule of thematerial; and the MIF module is further configured to calculate the ΣMIFbetween the different atoms and the resonant atom using the determinedmagnetic field strength at the test location, a Larmor PrecessionalFrequency of the resonant atom, the resonant frequency corresponding tothe maximum magnitude of the reflected wave, each MIF for each atom ofthe molecule different than the resonant atom and a resonant frequencyequation:RF=|(B+ΣMIF)(L) wherein MIF is a summation of magnetic influence factorsof the atoms of the molecule of the material different from the resonantatom.
 13. The apparatus of claim 9, wherein the antenna comprises: arod; a coil wound around the rod; a direct current (“DC”) current sourceconfigured to transmit a DC current in the coil, wherein DC current inthe coil induces a magnetic polarity in the antenna and DC current in anopposite direction in the coil induces an opposite magnetic polarity inthe rod; and a signal generator connected to the rod, the signalgenerator transmitting the test fundamental frequency to the rod,wherein the rod is positioned horizontally while transmitting the testsignal and detecting the reflected wave, and wherein detecting thereflected wave comprises detecting a downward force on the rod.
 14. Theapparatus of claim 9, further comprising, from a location different fromthe test location: the transmission circuit is configured to transmit asignal from the antenna at the location, the signal comprising afundamental frequency, the signal penetrating ground under the location,the location being selected to locate the material at a depth under thelocation, and the fundamental frequency matching the resonant frequencyof the resonant atom of the molecule of the material; the wave detectoris configured to detect a reflected wave on the antenna; a timerconfigured to determine a time difference between transmission of thesignal and detection of the reflected wave on the antenna; and the depthcalculator is configured to determine the depth to the material based onthe time difference and a reflected velocity corresponding to thematerial.
 15. The apparatus of claim 14, wherein the transmissioncircuit is a first transmission circuit, the wave detector is a firstwave detector, the timer is a first timer, the depth calculator is afirst depth calculator, the antenna is a first antenna set to a magneticpolarity, the signal from the first antenna is a first signal, the timedifference is a first time difference, the depth of the material is adepth to a top of the material, and further comprising, whiletransmitting the first signal by the first antenna: a secondtransmission circuit configured to transmit a second signal from asecond antenna located a distance from the first antenna, the secondsignal comprising the fundamental frequency, the second antenna set toan opposite magnetic polarity as the magnetic polarity of the firstantenna; a second wave detector configured to detect a reflected wave onthe second antenna; the second transmission circuit is configured torepeat, at varying distances from the first antenna, transmitting thesecond signal and detecting a reflected wave on the second signal tofind an edge location where a reflected wave is not detected by thesecond antenna; the second transmission circuit is configured totransmit the second signal from the second antenna at a signal detectionlocation; the second wave detector is configured to detect a reflectedwave on the second antenna at the signal detection location, the signaldetection location located nearer the first antenna than the edgelocation and close to the edge location; a second timer is configured todetermine a second time difference between transmission of the secondsignal and detection of the reflected wave on the second antenna; asecond depth calculator is configured to determine a first/second timedifference between the first time difference and the second timedifference; and a thickness calculator is configured to determine athickness of the material based on the first/second time difference andthe reflected velocity corresponding to the material.
 16. The apparatusof claim 14, wherein the reflected velocity corresponding to thematerial is an adjusted reflected velocity, and further comprising areflected velocity module configured to adjust the reflected velocitybased on a measurement of magnetic field strength, by a magnetometer, atthe test location based on equation:${RV}^{*} = {\frac{\left( {B - {512.47{mG}}} \right)}{512.47{mG}*{RV}*1.517} + {RV}}$wherein: B is the magnetic field strength measured at the test location;and RV is a calculated reflected velocity of the material at a referencelocation with a known depth of the material.